default search action
Nathan Kupp
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2015
- [j4]Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris:
Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. IEEE Des. Test 32(1): 53-60 (2015) - [c15]Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Yiorgos Makris:
Silicon Demonstration of Statistical Post-Production Tuning. ISVLSI 2015: 628-633 - [c14]Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Ke Huang, Yiorgos Makris:
A comparative study of one-shot statistical calibration methods for analog / RF ICs. ITC 2015: 1-10 - 2013
- [c13]Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris:
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. DATE 2013: 553-558 - [c12]Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris:
On combining alternate test with spatial correlation modeling in analog/RF ICs. ETS 2013: 1-6 - [c11]Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris:
Process monitoring through wafer-level spatial variation decomposition. ITC 2013: 1-10 - 2012
- [j3]Nathan Kupp, Yiorgos Makris:
Applying the Model-View-Controller Paradigm to Adaptive Test. IEEE Des. Test Comput. 29(1): 28-35 (2012) - [c10]Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris:
Spatial correlation modeling for probe test cost reduction in RF devices. ICCAD 2012: 23-29 - [c9]Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris:
Spatial estimation of wafer measurement parameters using Gaussian process models. ITC 2012: 1-8 - [c8]Nathan Kupp, Yiorgos Makris:
Integrated optimization of semiconductor manufacturing: A machine learning approach. ITC 2012: 1-10 - [c7]Dzmitry Maliuk, Nathan Kupp, Yiorgos Makris:
Towards a fully stand-alone analog/RF BIST: A cost-effective implementation of a neural classifier. VTS 2012: 62-67 - 2011
- [j2]Nathan Kupp, He Huang, Yiorgos Makris, Petros Drineas:
Improving Analog and RF Device Yield through Performance Calibration. IEEE Des. Test Comput. 28(3): 64-75 (2011) - [c6]Nathan Kupp, Mustapha Slamani, Yiorgos Makris:
Correlating inline data with final test outcomes in analog/RF devices. DATE 2011: 812-817 - [c5]Nathan Kupp, Haralampos-G. D. Stratigopoulos, Petros Drineas, Yiorgos Makris:
On proving the efficiency of alternative RF tests. ICCAD 2011: 762-767 - 2010
- [c4]Yier Jin, Nathan Kupp, Yiorgos Makris:
DFTT: Design for Trojan Test. ICECS 2010: 1168-1171 - [c3]Nathan Kupp, He Huang, Petros Drineas, Yiorgos Makris:
Post-production performance calibration in analog/RF devices. ITC 2010: 245-254
2000 – 2009
- 2009
- [j1]Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris:
On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction. J. Electron. Test. 25(6): 309-321 (2009) - [c2]Yier Jin, Nathan Kupp, Yiorgos Makris:
Experiences in Hardware Trojan Design and Implementation. HOST 2009: 50-57 - 2008
- [c1]Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris:
Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction. ETS 2008: 35-40
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from , , and to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 23:10 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint