"Handling discontinuous effects in modeling spatial correlation of ..."

Ke Huang et al. (2013)

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DOI: 10.7873/DATE.2013.123

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-27

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Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris:
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. DATE 2013: 553-558

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