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ORCIDGaspard Hiblot
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2020 – today
- 2023
[c10]Gaspard Hiblot, Taras Ravsher, Roger Loo
, Bhuvaneshwari Yengula Venkata Ramana, Nathali Franchina-Vergel, Andrea Fantini, Shamin Houshmand Sharifi, Nina Bazzazian, Kurt Wostyn, Loris Angelo Labbate, Sebastien Couet, Gouri Sankar Kar:
NPN Si/SiGe memory selector with non-linearity>105 and ON-current>6MA/cm2. ESSDERC 2023: 164-167- [c9]Subrat Mishra, Sankatali Venkateswarlu, Bjorn Vermeersch, Moritz Brunion, Melina Lofrano, Dawit Burusie Abdi, Herman Oprins, Dwaipayan Biswas, Odysseas Zografos, Gaspard Hiblot, Geert Van der Plas, Pieter Weckx, Geert Hellings, James Myers, Francky Catthoor, Julien Ryckaert:
Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs). IRPS 2023: 1-7 - [c8]S. Yang, Pieter Schuddinck, Marie Garcia Bardon, Yang Xiang, Anabela Veloso, B. T. Chan, Gioele Mirabelli, Gaspard Hiblot, Geert Hellings, Julien Ryckaert:
PPA and Scaling Potential of Backside Power Options in N2 and A14 Nanosheet Technology. VLSI Technology and Circuits 2023: 1-2 - 2022
- [c7]Anabela Veloso, Anne Jourdain, D. Radisic, Rongmei Chen, G. Arutchelvan, B. O'Sullivan, Hiroaki Arimura, Michele Stucchi, An De Keersgieter, M. Hosseini, T. Hopf, K. D'Have, S. Wang, E. Dupuy, G. Mannaert, Kevin Vandersmissen, S. Iacovo, P. Marien, S. Choudhury, F. Schleicher, F. Sebaai, Yusuke Oniki, X. Zhou, A. Gupta, Tom Schram, B. Briggs, C. Lorant, E. Rosseel, Andriy Hikavyy, Roger Loo, J. Geypen, D. Batuk, G. T. Martinez, J. P. Soulie, Katia Devriendt, B. T. Chan, S. Demuynck, Gaspard Hiblot, Geert Van der Plas, Julien Ryckaert, Gerald Beyer, E. Dentoni Litta, Eric Beyne, Naoto Horiguchi:
Scaled FinFETs Connected by Using Both Wafer Sides for Routing via Buried Power Rails. VLSI Technology and Circuits 2022: 284-285 - 2021
- [c6]Gaspard Hiblot, Nouredine Rassoul, Lieve Teugels, Katia Devriendt, Adrian Vaisman Chasin, Michiel J. van Setten, Attilio Belmonte, Romain Delhougne, Gouri Sankar Kar:
Process-induced charging damage in IGZO nTFTs. IRPS 2021: 1-8
2010 – 2019
- 2019
- [c5]Gaspard Hiblot, Yefan Liu, Geert Hellings, Geert Van der Plas:
Comparative Analysis of the Degradation Mechanisms in Logic and I/O FinFET Devices Induced by Plasma Damage. IRPS 2019: 1-5 - [c4]Yefan Liu, Hao Yu, Gaspard Hiblot, Anastasiia Kruv, Marc Schaekers, Naoto Horiguchi, Dimitrios Velenis, Ingrid De Wolf:
Study of the Mechanical Stress Impact on Silicide Contact Resistance by 4-Point Bending. IRPS 2019: 1-5 - 2015
- [c3]Gaspard Hiblot, Quentin Rafhay, Loic Gaben, Gérard Ghibaudo, Frédéric Boeuf:
Optimization of Trigate-On-Insulator MOSFET aspect ratio with MASTAR. ESSDERC 2015: 242-245 - [c2]Gaspard Hiblot, Quentin Rafhay, Frédéric Boeuf, Gérard Ghibaudo:
Impact of short-channel effects on velocity overshoot in MOSFET. NEWCAS 2015: 1-4 - 2014
- [c1]Gaspard Hiblot, Quentin Rafhay, Frédéric Boeuf, Gérard Ghibaudo:
Impact of quantum modulation of the inversion charge in the MOSFET subthreshold regime. ESSDERC 2014: 286-289
Coauthor Index
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