• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 35 matches

• 2000
• 
  Ahmad Abdelhay, Emmanuel Simeu:
  Analytical Redundancy Based Approach for Concurrent Fault Detection in Linear Digital Systems. IOLTW 2000: 112-
• 
  Miron Abramovici, Charles E. Stroud, Brandon Skaggs, John Marty Emmert:
  Improving On-Line BIST-Based Diagnosis for Roving STARs. IOLTW 2000: 31-39
• 
  Bartomeu Alorda, Ivan de Paúl, Jaume Segura, T. Miller:
  On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor. IOLTW 2000: 87-91
• 
  Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
  A Family of Self-Repair SRAM Cores. IOLTW 2000: 214-218
• 
  Alfredo Benso, Silvia Chiusano, Paolo Prinetto:
  A COTS Wrapping Toolkit for Fault Tolerant Applications under Windows NT. IOLTW 2000: 9-16
• 
  Debaleena Das, Nur A. Touba, Markus Seuring, Michael Gössel:
  Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes. IOLTW 2000: 171-
• 
  Daniel Gil, Joaquin Gracia, Juan Carlos Baraza, Pedro J. Gil:
  A Study of the Effects of Transient Fault Injection into the VHDL Model of a Fault-Tolerant Microcomputer System. IOLTW 2000: 73-79
• 
  Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel:
  Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults. IOLTW 2000: 121-126
• 
  Michael Gössel, Alexej Dmitriev, Vladimir V. Saposhnikov, Valerij V. Saposhnikov:
  A New Method for Concurrent Checking by Use of a 1-out-of-4 Code. IOLTW 2000: 147-152
• 
  K. D. R. Jagath-Kumara:
  Theoretical Performance Bounds of a Probability of Bit Error Estimator Used in Digital Links Employing Binary Block Codes. IOLTW 2000: 165-168
• 
  Naotake Kamiura, Masashi Tomita, Teijiro Isokawa, Nobuyuki Matsui:
  On Realization of Fault-Tolerant Fuzzy Controllers. IOLTW 2000: 185-190
• 
  Andrzej Krasniewski:
  Self-Testing of FPGA Delay Faults in the System Environment. IOLTW 2000: 40-
• 
  Yvan Maidon, Yann Deval, Jean-Baptiste Bégueret:
  An Improved CMOS BICS for On-Line Testing. IOLTW 2000: 100-
• 
  Martin Margala, Srdjan Dragic, Ahmed El-Abasiry, Samuel Ekpe, Viera Stopjaková:
  I-V Fast IDDQ Current Sensor for On-Line Mixed-Signal/Analog Test. IOLTW 2000: 92-93
• 
  Anzhela Yu. Matrosova, Sergey Ostanin:
  Self-Checking FSM Design with Observing only FSM Outputs. IOLTW 2000: 153-154
• 
  Paolo Migliavacca:
  Faster Time-to-Market, Lower Cost of Development and Test for Standard Analog IC. IOLTW 2000: 155-
• 
  Andrej A. Morosov, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel:
  New Self-Checking Circuits by Use of Berger-Codes. IOLTW 2000: 141-146
• 
  Mohammad A. Naal, Emmanuel Simeu:
  High-Level Synthesis Methodology for On-Line Testability Optimization. IOLTW 2000: 201-206
• 
  Michael Nicolaidis, N. Zaidan, Th. Calin, D. Bied-Charreton:
  ISIS: A Fail-Safe Interface Realized in Smart Power Technology. IOLTW 2000: 191-
• 
  M. E. Nillesen, A. Del Pizzo, M. Pasquariello, R. Rizzo:
  A Very Flexible DSP-Based Controller for On-Line Test and Control of Industrial Processes. IOLTW 2000: 179-184
• 
  Ondrej Novák, Jiri Nosek:
  On Using Deterministic Test Sets in BIST. IOLTW 2000: 127-132
• 
  B. Parrotta, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante:
  New Techniques for Accelerating Fault Injection in VHDL Descriptions. IOLTW 2000: 61-66
• 
  Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet:
  An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW 2000: 52-
• 
  Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, Ph. Cheynet, Bogdan Nicolescu, Raoul Velazco:
  Evaluating the Effectiveness of a Software Fault-Tolerance Technique on RISC- and CISC-Based Architectures. IOLTW 2000: 17-
• 
  José Antonio Sainz, R. Muñoz, J. A. Maiz, L. A. Aguado, Miquel Roca:
  A Crosstalk Sensor Implementation for Measuring Interferences in Digital CMOS VLSI Circuits. IOLTW 2000: 45-51
• 
  Jose Miguel Vieira dos Santos:
  Concurrent Scan Monitoring and Multi-Pattern Search. IOLTW 2000: 107-111
• 
  Lukás Sekanina, Vladimír Drábek:
  Relation between Fault Tolerance and Reconfiguration in Cellular Systems. IOLTW 2000: 25-30
• 
  Janusz Sosnowski:
  Improving Fault Coverage in System Tests. IOLTW 2000: 207-213
• 
  Y. Tsiatouhas, Th. Haniotakis, Dimitris Nikolos:
  A Compact Built-In Current Sensor for IDDQ Testing. IOLTW 2000: 95-99
• 
  T. Vallino, Abbas Dandache, Jean-Paul Delahaye, Fabrice Monteiro, Bernard Lepley:
  A Stamping Technique to Increase the Error Correction Capacity of the (127, k, d) RS Code. IOLTW 2000: 169-170

skipping 5 more matches