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Monica Lobetti Bodoni
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2000 – 2009
- 2003
- [j4]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures. IEEE Commun. Mag. 41(9): 90-97 (2003) - [j3]Monica Lobetti Bodoni, Ben Bennetts:
Guest Editors' Introduction: Board Test. IEEE Des. Test Comput. 20(2): 5-7 (2003) - 2002
- [c8]Monica Lobetti Bodoni:
Panel: "Board Test and ITC: What Does the Future Hold?". ITC 2002: 1239 - 2001
- [j2]Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
Online and Offline BIST in IP-Core Design. IEEE Des. Test Comput. 18(5): 92-99 (2001) - 2000
- [c7]Monica Lobetti Bodoni, Alfredo Benso, Silvia Chiusano, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
An effective distributed BIST architecture for RAMs. ETW 2000: 119-124 - [c6]Alfredo Benso, Stefano Di Carlo, Silvia Chiusano, Paolo Prinetto, Fabio Ricciato, Monica Lobetti Bodoni, Maurizio Spadari:
On Integrating a Proprietary and a Commercial Architecture for Optimal BIST Performances in SoCs. ICCD 2000: 539-540 - [c5]Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
A Family of Self-Repair SRAM Cores. IOLTW 2000: 214-218 - [c4]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
A programmable BIST architecture for clusters of multiple-port SRAMs. ITC 2000: 557-566
1990 – 1999
- 1999
- [j1]Stefano Barbagallo, Monica Lobetti Bodoni, Alfredo Benso, Silvia Chiusano, Paolo Prinetto:
Testing embedded memories in telecommunication systems. IEEE Commun. Mag. 37(6): 84-89 (1999) - [c3]Monica Lobetti Bodoni, Alessio Pricco, Alfredo Benso, Silvia Chiusano, Paolo Prinetto:
An on-line BISTed SRAM IP core. ITC 1999: 993-1000 - 1996
- [c2]Stefano Barbagallo, Monica Lobetti Bodoni, Davide Medina, Gabriel de Blasio, M. Ferloni, Franco Fummi, Donatella Sciuto:
A Parametric Design of a Built-in Self-Test FIFO Embedded Memory. DFT 1996: 221-230 - [c1]Stefano Barbagallo, Monica Lobetti Bodoni, Davide Medina, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda:
Scan insertion criteria for low design impact. VTS 1996: 26-31
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