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2020 – today
- 2024
[j10]Daniel Gil-Tomas
, Luis J. Saiz-Adalid, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Pedro J. Gil-Vicente:
A Hybrid Technique Based on ECC and Hardened Cells for Tolerating Random Multiple-Bit Upsets in SRAM Arrays. IEEE Access 12: 70662-70675 (2024)- [c26]Juan Carlos Ruiz, David de Andrés, Luis J. Saiz-Adalid, Joaquin Gracia-Moran:
Zero-Space In-Weight and In-Bias Protection for Floating-Point-based CNNs. EDCC 2024: 89-96 - [c25]Joaquin Gracia-Moran, Juan Carlos Ruiz, David de Andrés, Luis J. Saiz-Adalid:
Allocating ECC parity bits into BF16-encoded CNN parameters: A practical experience report. LADC 2024: 75-80 - [c24]Juan Carlos Ruiz, David de Andrés, Luis J. Saiz-Adalid, Joaquin Gracia-Moran:
In-Memory Zero-Space Floating-Point-Based CNN Protection Using Non-significant and Invariant Bits. SAFECOMP 2024: 3-17
2010 – 2019
- 2019
- [j9]Luis J. Saiz-Adalid, Joaquin Gracia-Moran, Daniel Gil-Tomas, Juan-Carlos Baraza-Calvo, Pedro J. Gil-Vicente:
Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection. IEEE Access 7: 151131-151143 (2019) - 2018
- [j8]Joaquin Gracia-Moran, Luis J. Saiz-Adalid, Daniel Gil-Tomas, Pedro J. Gil-Vicente:
Improving Error Correction Codes for Multiple-Cell Upsets in Space Applications. IEEE Trans. Very Large Scale Integr. Syst. 26(10): 2132-2142 (2018) - [c23]Joaquin Gracia-Moran, Luis J. Saiz-Adalid, Juan-Carlos Baraza-Calvo, Pedro J. Gil:
Correction of Adjacent Errors with Low Redundant Matrix Error Correction Codes. LADC 2018: 107-114 - 2016
- [j7]Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Injecting Intermittent Faults for the Dependability Assessment of a Fault-Tolerant Microcomputer System. IEEE Trans. Reliab. 65(2): 648-661 (2016) - [c22]Luis J. Saiz-Adalid, Pedro J. Gil, Juan Carlos Ruiz, Joaquin Gracia-Moran, Daniel Gil-Tomas, Juan-Carlos Baraza-Calvo:
Ultrafast Error Correction Codes for Double Error Detection/Correction. EDCC 2016: 108-119 - 2015
- [c21]Luis J. Saiz-Adalid, Pedro J. Gil, Joaquin Gracia-Moran, Daniel Gil-Tomas, Juan-Carlos Baraza-Calvo:
Ultrafast Single Error Correction Codes for Protecting Processor Registers. EDCC 2015: 144-154 - [c20]Isabelle Hupont, Joaquin Gracia, Luis Miguel Sanagustín, Miguel Angel Gracia:
How do new visual immersive systems influence gaming QoE? A use case of serious gaming with Oculus Rift. QoMEX 2015: 1-6 - 2014
- [j6]Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Daniel Gil-Tomas, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Effects of Intermittent Faults on the Reliability of a Reduced Instruction Set Computing (RISC) Microprocessor. IEEE Trans. Reliab. 63(1): 144-153 (2014) - [c19]Luis J. Saiz-Adalid, Pedro J. Gil, Juan-Carlos Baraza-Calvo, Juan-Carlos Ruiz-Garcia, Daniel Gil-Tomas, Joaquin Gracia-Moran:
Modified Hamming Codes to Enhance Short Burst Error Detection in Semiconductor Memories (Short Paper). EDCC 2014: 62-65 - 2013
- [c18]Joaquin Gracia-Moran, Juan-Carlos Ruiz-Garcia, Juan-Carlos Baraza-Calvo, David de Andrés, Pedro J. Gil:
Improving the Transfer of Safety and Security Competences to Industry: The RISKY Approach. EWDC 2013: 185-189 - [c17]Luis J. Saiz-Adalid, Pedro J. Gil, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo:
Using Interleaving to Avoid the Effects of Multiple Adjacent Faults in On-Chip Interconnection Lines. EWDC 2013: 198-201 - [c16]Joaquin Gracia-Moran, Daniel Gil-Tomas, Luis J. Saiz-Adalid, Juan-Carlos Baraza-Calvo, Pedro J. Gil-Vicente:
Defining a Representative and Low Cost Fault Model Set for Intermittent Faults in Microprocessor Buses. LADC 2013: 98-103 - [c15]Luis J. Saiz-Adalid, Pedro J. Gil-Vicente, Juan-Carlos Ruiz-Garcia, Daniel Gil-Tomas, Juan Carlos Baraza, Joaquin Gracia-Moran:
Flexible Unequal Error Control Codes with Selectable Error Detection and Correction Levels. SAFECOMP 2013: 178-189 - 2012
- [j5]Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection. IEEE Des. Test 29(6): 66-73 (2012) - [j4]Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Studying the effects of intermittent faults on a microcontroller. Microelectron. Reliab. 52(11): 2837-2846 (2012) - 2010
- [c14]Joaquin Gracia-Moran, Daniel Gil-Tomas, Luis J. Saiz-Adalid, Juan Carlos Baraza, Pedro J. Gil-Vicente:
Experimental validation of a fault tolerant microcomputer system against intermittent faults. DSN 2010: 413-418 - [c13]Joaquin Gracia-Moran, Daniel Gil-Tomas, Juan Carlos Baraza, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Searching Representative and Low Cost Fault Models for Intermittent Faults in Microcontrollers: A Case Study. PRDC 2010: 11-18
2000 – 2009
- 2008
- [j3]Juan Carlos Baraza, Joaquin Gracia, Sara Blanc, Daniel Gil, Pedro J. Gil:
Enhancement of Fault Injection Techniques Based on the Modification of VHDL Code. IEEE Trans. Very Large Scale Integr. Syst. 16(6): 693-706 (2008) - [c12]Joaquin Gracia, Luis J. Saiz, Juan Carlos Baraza, Daniel Gil, Pedro J. Gil:
Analysis of the influence of intermittent faults in a microcontroller. DDECS 2008: 80-85 - [c11]Daniel Gil, Luis J. Saiz, Joaquin Gracia, Juan Carlos Baraza, Pedro J. Gil:
Injecting intermittent faults for the dependability validation of commercial microcontrollers. HLDVT 2008: 177-184 - 2005
- [c10]Daniel Gil, Joaquin Gracia, Juan Carlos Baraza, Pedro J. Gil:
Impact of Faults in Combinational Logic of Commercial Microcontrollers. EDCC 2005: 379-390 - [c9]Juan Carlos Baraza, Joaquin Gracia, Daniel Gil, Pedro J. Gil:
Improvement of fault injection techniques based on VHDL code modification. HLDVT 2005: 19-26 - 2004
- [c8]Sara Blanc, Joaquin Gracia, Pedro J. Gil:
Experiences during the Experimental Validation of the Time-Triggered Architecture. DATE 2004: 256-261 - [c7]Daniel Gil, Joaquin Gracia, Juan Carlos Baraza, Pedro J. Gil:
Analysis of the influence of processor hidden registers on the accuracy of fault injection techniques. HLDVT 2004: 173-178 - 2003
- [j2]Daniel Gil, Joaquin Gracia, Juan Carlos Baraza, Pedro J. Gil:
Study, comparison and application of different VHDL-based fault injection techniques for the experimental validation of a fault-tolerant system. Microelectron. J. 34(1): 41-51 (2003) - 2002
- [j1]Juan Carlos Baraza, Joaquin Gracia, Daniel Gil, Pedro J. Gil:
A prototype of a VHDL-based fault injection tool: description and application. J. Syst. Archit. 47(10): 847-867 (2002) - [c6]Sara Blanc, Joaquin Gracia, Pedro J. Gil:
A Fault Hypothesis Study on the TTP/C Using VHDL-Based and Pin-Level Fault Injection Techniques. DFT 2002: 254-262 - [c5]Joaquin Gracia, Daniel Gil, Juan Carlos Baraza, Pedro J. Gil:
Using VHDL-Based Fault Injection to exercise Error Detection Mechanisms in the Time-Triggered Architecture. PRDC 2002: 316-320 - 2001
- [c4]Joaquin Gracia, Juan Carlos Baraza, Daniel Gil, Pedro J. Gil:
Comparison and Application of Different VHDL-Based Fault Injection Techniques. DFT 2001: 233-241 - [c3]Joaquin Gracia, Juan Carlos Baraza, Daniel Gil, Pedro J. Gil:
A Study of the Experimental Validation of Fault-Tolerant Systems Using Different VHDL-Based Fault Injection Techniques. IOLTW 2001: 140 - 2000
- [c2]Juan Carlos Baraza, Joaquin Gracia, Daniel Gil, Pedro J. Gil:
A Prototype of a VHDL-Based Fault Injection Tool. DFT 2000: 396-404 - [c1]Daniel Gil, Joaquin Gracia, Juan Carlos Baraza, Pedro J. Gil:
A Study of the Effects of Transient Fault Injection into the VHDL Model of a Fault-Tolerant Microcomputer System. IOLTW 2000: 73-79
Coauthor Index
aka: Juan-Carlos Baraza-Calvo
aka: Daniel Gil-Tomas
aka: Pedro J. Gil-Vicente
aka: Luis J. Saiz-Adalid
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