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Publication search results
found 101 matches
- 2007
- Jacob Abraham:
Keynote Speech 1: New Paths for Test. ATS 2007: 3 - Selim Sermet Akbay, Shreyas Sen, Abhijit Chatterjee:
Testing RF Components with Supply Current Signatures. ATS 2007: 393-398 - Florence Azaïs, Laurent Larguier, Michel Renovell:
Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits. ATS 2007: 239-244 - Magali Bastian, Vincent Gouin, Patrick Girard, Christian Landrault, Alexandre Ney, Serge Pravossoudovitch, Arnaud Virazel:
Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior. ATS 2007: 507-510 - David Bement, David Karr:
Bluetooth Hopping BER Testing Methodologies on a Production Test Platform. ATS 2007: 517 - Krishna Chakravadhanula, Nitin Parimi, Brian Foutz, Bing Li, Vivek Chickermane:
Low Power Reduced Pin Count Test Methodology. ATS 2007: 251-258 - Bo-Hua Chen, Wei-Chung Kao, Bing-Chuan Bai, Shyue-Tsong Shen, James C.-M. Li:
Response Inversion Scan Cell (RISC): A Peak Capture Power Reduction Technique. ATS 2007: 425-432 - Mingjing Chen, Alex Orailoglu:
Improving Circuit Robustness with Cost-Effective Soft-Error-Tolerant Sequential Elements. ATS 2007: 307-312 - Hung-Kai Chen, Chauchin Su:
A Test and Diagnosis Methodology for RF Transceivers. ATS 2007: 135-138 - Jacob Abraham, Salvador Mir, Yinghua Min, Jeremy Wang, Cheng-Wen Wu:
Test Education in the Global Economy. ATS 2007: 53 - Nai-Chen Daniel Cheng, Yu Lee, Ji-Jan Chen:
A 2-ps Resolution Wide Range BIST Circuit for Jitter Measurement. ATS 2007: 219-223 - Choon-Sang Chew:
Issues Regarding New Product Release in Semiconductor Manufacturing. ATS 2007: 473 - Kary Chien:
Invited Talk 3: Foundry Full-Scale Reliability Testing Capability Setup for Advanced Technology. ATS 2007: 9 - Sunghoon Chun, YongJoon Kim, Sungho Kang:
High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects. ATS 2007: 115-120 - Ramashis Das, John P. Hayes:
Monitoring Transient Errors in Sequential Circuits. ATS 2007: 319-322 - Li-Ming Denq, Cheng-Wen Wu:
A Hybrid BIST Scheme for Multiple Heterogeneous Embedded Memories. ATS 2007: 349-354 - Stephan Eggersglüß, Rolf Drechsler:
Improving Test Pattern Compactness in SAT-based ATPG. ATS 2007: 445-452 - Aiman H. El-Maleh, Mustafa Imran Ali, Ahmad A. Al-Yamani:
A Reconfigurable Broadcast Scan Compression Scheme Using Relaxation Based Test Vector Decompos. ATS 2007: 91-94 - Piet Engelke, Bettina Braitling, Ilia Polian, Michel Renovell, Bernd Becker:
SUPERB: Simulator Utilizing Parallel Evaluation of Resistive Bridges. ATS 2007: 433-438 - Xiaoxin Fan, Yu Hu, Laung-Terng Wang:
An On-Chip Test Clock Control Scheme for Multi-Clock At-Speed Testing. ATS 2007: 341-348 - Jenny Fan, Xiao-Yu Li, Ismed Hartanto:
Using FPGA configuration memory to accelerate yield learning for advanced process. ATS 2007: 511-516 - Liquan Fang, Yang Zhong, H. van de Donk, Yizi Xing:
Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC. ATS 2007: 404-412 - Chandan Giri, Pradeep Kumar Choudhary, Santanu Chattopadhyay:
Scan Power Reduction Through Scan Architecture Modification And Test Vector Reordering. ATS 2007: 419-424 - Ruifeng Guo, Yu Huang, Wu-Tung Cheng:
Fault Dictionary Based Scan Chain Failure Diagnosis. ATS 2007: 45-52 - Masaki Hashizume, Yutaka Hata, Tomomi Nishida, Hiroyuki Yotsuyanagi, Yukiya Miura:
Current Testable Design of Resistor String DACs. ATS 2007: 399-403 - Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu:
Test Generation for Transistor Shorts using Stuck-at Fault Simulator and Test Generator. ATS 2007: 271-274 - Dongwoo Hong, Kwang-Ting Cheng:
An Accurate Jitter Estimation Technique for Efficient High Speed I/O Testing. ATS 2007: 224-229 - Toshinori Hosokawa, Ryoichi Inoue, Hideo Fujiwara:
Fault-dependent/independent Test Generation Methods for State Observable FSMs. ATS 2007: 275-280 - Hsieh-Hung Hsieh, Yen-Chih Huang, Liang-Hung Lu, Guo-Wei Huang:
A BIST Technique for RF Voltage-Controlled Oscillators. ATS 2007: 143-148 - Tong-Yu Hsieh, Kuen-Jong Lee, Jian-Jhih You:
Test Efficiency Analysis and Improvement of SOC Test Platforms. ATS 2007: 463-466
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