"High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation ..."

Sunghoon Chun, YongJoon Kim, Sungho Kang (2007)

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DOI: 10.1109/ATS.2007.58

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-27

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Sunghoon Chun, YongJoon Kim, Sungho Kang:
High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects. ATS 2007: 115-120

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