"An On-Chip Test Clock Control Scheme for Multi-Clock At-Speed Testing."

Xiaoxin Fan, Yu Hu, Laung-Terng Wang (2007)

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DOI: 10.1109/ATS.2007.61

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-09

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Xiaoxin Fan, Yu Hu, Laung-Terng Wang:
An On-Chip Test Clock Control Scheme for Multi-Clock At-Speed Testing. ATS 2007: 341-348

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