default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDNagesh Tamarapalli
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
Journal Articles
- 2003
[j3]Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli:
High-Frequency, At-Speed Scan Testing. IEEE Des. Test Comput. 20(5): 17-25 (2003)- [j2]Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian:
Embedded Deterministic Test for Low-Cost Manufacturing. IEEE Des. Test Comput. 20(5): 58-66 (2003) - 2000
- [j1]Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer:
Automated synthesis of phase shifters for built-in self-testapplications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(10): 1175-1188 (2000)
Conference and Workshop Papers
- 2015
- [c19]Nagesh Tamarapalli, Prashanth Vallur, Sachin Kulkarni:
Tutorial T5: High Performance Low Power Designs - Challenges and Best practices in Design, Verification and Test. VLSID 2015: 10-11 - 2014
- [c18]Rahul Shukla, Phong Loi, Ken Pham, Arie Margulis, Kathy Yang, Nagesh Tamarapalli:
Application of Test-View Modeling to Hierarchical ATPG. VLSID 2014: 110-115 - 2013
- [c17]Prabhat Mishra, Masahiro Fujita, Virendra Singh, Nagesh Tamarapalli, Sharad Kumar, Rajesh Mittal:
Tutorial T10: Post - Silicon Validation, Debug and Diagnosis. VLSI Design 2013 - 2012
- [c16]Srikanth Venkataraman, Nagesh Tamarapalli:
Tutorial T3: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. VLSI Design 2012: 16-17 - 2008
- [c15]Srikanth Venkataraman, Nagesh Tamarapalli:
DFM / DFT / SiliconDebug / Diagnosis. VLSI Design 2008: 5-6 - 2006
- [c14]Andreas Leininger, Ajay Khoche, Martin Fischer, Nagesh Tamarapalli, Wu-Tung Cheng, Randy Klingenberg, Wu Yang:
The Next Step in Volume Scan Diagnosis: Standard Fail Data Format. ATS 2006: 360-368 - [c13]Yu Huang, Wu-Tung Cheng, Nagesh Tamarapalli, Janusz Rajski, Randy Klingenberg, Will Hsu, Yuan-Shih Chen:
Diagnosis with Limited Failure Information. ITC 2006: 1-10 - [c12]Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware:
A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC 2006: 1-10 - [c11]Nandu Tendolkar, Dawit Belete, Bill Schwarz, Bob Podnar, Akshay Gupta, Steve Karako, Wu-Tung Cheng, Alex Babin, Kun-Han Tsai, Nagesh Tamarapalli, Greg Aldrich:
Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis. ITC 2006: 1-9 - [c10]David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman:
DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. VLSI Design 2006: 14 - 2005
- [c9]Nagesh Tamarapalli:
Achieving higher yield through diagnosis. ITC 2005: 1 - [c8]Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai:
Compression mode diagnosis enables high volume monitoring diagnosis flow. ITC 2005: 10 - 2004
- [c7]Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli, Janusz Rajski:
Compactor Independent Direct Diagnosis. Asian Test Symposium 2004: 204-209 - 2003
- [c6]Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski:
Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040 - [c5]Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski:
Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. ITC 2003: 1211-1220 - 2002
- [c4]Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian:
Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310 - 1999
- [c3]Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski:
Logic BIST for large industrial designs: real issues and case studies. ITC 1999: 358-367 - 1998
- [c2]Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer:
Automated synthesis of large phase shifters for built-in self-test. ITC 1998: 1047-1056 - 1996
- [c1]Nagesh Tamarapalli, Janusz Rajski:
Constructive Multi-Phase Test Point Insertion for Scan-Based BIST. ITC 1996: 649-658
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 23:11 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
