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ORCIDJ. S. Yuan
This is just a disambiguation page, and is not intended to be the bibliography of an actual person. Any publication listed on this page has not been assigned to an actual author yet. If you know the true author of one of the publications listed below, you are welcome to contact us.
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2010 – 2019
- 2014
[j11]J. S. Yuan, S. Chen:
Power amplifier resilient design for process and temperature variations using an on-chip PLL sensing signal. Microelectron. Reliab. 54(1): 167-171 (2014)- 2013
- [j10]J. S. Yuan, E. Kritchanchai:
Power amplifier resilient design for process, voltage, and temperature variations. Microelectron. Reliab. 53(6): 856-860 (2013) - [j9]J.-S. Yuan, Y. Wang, J. Steighner, H.-D. Yen, S.-L. Jang, G.-W. Huang, W.-K. Yeh:
Reliability analysis of pHEMT power amplifier with an on-chip linearizer. Microelectron. Reliab. 53(6): 878-884 (2013)
2000 – 2009
- 2006
- [j8]Chuanzhao Yu, J. S. Yuan, Enjun Xiao:
Dynamic voltage stress effects on nMOS varactor. Microelectron. Reliab. 46(9-11): 1812-1816 (2006) - 2005
- [j7]Chuanzhao Yu, Hong Yang, Enjun Xiao, J. S. Yuan:
Voltage stress-induced performance degradation in NMOSFET mixer. IEICE Electron. Express 2(5): 133-137 (2005) - [j6]Enjun Xiao, P. P. Ghosh, Chuanzhao Yu, J. S. Yuan:
Hot carrier and soft breakdown effects on LNA performance for ultra wideband communications. Microelectron. Reliab. 45(9-11): 1382-1385 (2005) - [j5]Chuanzhao Yu, Enjun Xiao, J. S. Yuan:
Voltage stress-induced hot carrier effects on SiGe HBT VCO. Microelectron. Reliab. 45(9-11): 1402-1405 (2005) - [j4]Chuanzhao Yu, J. S. Yuan, Anwar Sadat
:
Dynamic stress-induced high-frequency noise degradations in nMOSFETs. Microelectron. Reliab. 45(9-11): 1794-1799 (2005) - [j3]Anwar Sadat, Hongwei Qu, Chuanzhao Yu, J. S. Yuan, Huikai Xie:
Low-power CMOS wireless MEMS motion sensor for physiological activity monitoring. IEEE Trans. Circuits Syst. I Regul. Pap. 52-I(12): 2539-2551 (2005) - [j2]J. S. Yuan, Li Yang:
Teaching digital noise and noise margin issues in engineering education. IEEE Trans. Educ. 48(1): 162-168 (2005) - 2003
- [c10]Li Yang, J. S. Yuan:
A decoupling technique for CMOS strong-coupled structures. ACM Great Lakes Symposium on VLSI 2003: 128-131 - [c9]Li Yang, J. S. Yuan:
Design of enhancement current-balanced logic for mixed-signal ICs. ISCAS (1) 2003: 761-764 - [c8]Li Yang, J. S. Yuan:
Analyzing Internal-Switching Induced Simultaneous Switching Noise. ISQED 2003: 410-415 - [c7]W. Kuang, J. S. Yuan, Abdel Ejnioui:
Supply Voltage Scalable System Design Using Self-Timed Circuits. ISVLSI 2003: 161-166 - [c6]Li Yang, J. S. Yuan:
Enhanced Techniques for Current Balanced Logic in Mixed-Signal ICs. ISVLSI 2003: 278-279 - [c5]W. Kuang, J. S. Yuan:
An Adaptive Supply-Voltage Scheme for Low Power Self-Timed CMOS Digital Design. VLSI Design 2003: 315-319 - 2002
- [c4]Li Yang, J. S. Yuan, M. Hagedorn:
Modeling the output waveform of CMOS gate with feedback effect. ICECS 2002: 1127-1130 - 2001
- [c3]Wei Li, Qiang Li, J. S. Yuan, Joshua McConkey, Yuan Chen, Sundar Chetlur, Jonathan Zhou, A. S. Oates:
Hot-carrier-Induced Circuit Degradation for 0.18 µm CMOS Technology. ISQED 2001: 284-289
1990 – 1999
- 1996
- [c2]Y. Dai, J. S. Yuan, A. M. Phanse, C. S. Yeh, K. Kwang:
Scalable bipolar model for BiCMOS and bipolar circuits. ICECS 1996: 868-871 - [c1]J. Song, J. S. Yuan, F. Schwierz, D. Schipanski:
Effects of Ge profiles on base transit time and base resistance of SiGe HBT's. ICECS 1996: 876-879
1980 – 1989
- 1988
- [j1]J. S. Yuan:
Closed-loop manipulator control using quaternion feedback. IEEE J. Robotics Autom. 4(4): 434-440 (1988)
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