"Voltage stress-induced performance degradation in NMOSFET mixer."

Chuanzhao Yu et al. (2005)

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DOI: 10.1587/ELEX.2.133

access: open

type: Journal Article

metadata version: 2021-02-12

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Chuanzhao Yu, Hong Yang, Enjun Xiao, J. S. Yuan:
Voltage stress-induced performance degradation in NMOSFET mixer. IEICE Electron. Express 2(5): 133-137 (2005)

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