default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDA. S. Oates
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2019
[c6]Ming-Hsien Lin, W. S. Chou, Y. T. Yang, A. S. Oates:
Characterization of Critical Peak Current and General Model of Interconnect Systems Under Short Pulse-Width Conditions. IRPS 2019: 1-7- 2018
- [c5]Pin-Shiang Chen, Shou-Chung Lee, A. S. Oates, Chee Wee Liu:
BEOL TDDB reliability modeling and lifetime prediction using critical energy to breakdown. IRPS 2018: 6 - [c4]Yi Ching Ong, Shou-Chung Lee, A. S. Oates:
Percolation defect nucleation and growth as a description of the statistics of electrical breakdown for gate, MOL and BEOL dielectrics. IRPS 2018: 7-1 - 2015
- [c3]M. H. Lin, A. S. Oates:
Mechanisms of electromigration under AC and pulsed-DC stress in Cu/low-k dual damascene interconnects. IRPS 2015: 2 - [c2]Shou-Chung Lee, A. S. Oates:
On the voltage dependence of copper/low-k dielectric breakdown. IRPS 2015: 3
2000 – 2009
- 2006
- [j4]A. S. Oates, Shou-Chung Lee:
Electromigration failure distributions of dual damascene Cu /low - k interconnects. Microelectron. Reliab. 46(9-11): 1581-1586 (2006) - 2004
- [j3]Merlyne M. De Souza, S. K. Manhas, D. Chandra Sekhar, A. S. Oates, Prasad Chaparala:
Influence of mobility model on extraction of stress dependent source-drain series resistance. Microelectron. Reliab. 44(1): 25-32 (2004) - 2003
- [j2]S. K. Manhas, D. Chandra Sekhar, A. S. Oates, Merlyne M. De Souza:
Characterisation of series resistance degradation through charge pumping technique. Microelectron. Reliab. 43(4): 617-624 (2003) - 2001
- [j1]Merlyne M. De Souza, J. Wang, S. K. Manhas, E. M. Sankara Narayanan, A. S. Oates:
A comparison of early stage hot carrier degradation behaviour in 5 and 3 V sub-micron low doped drain metal oxide semiconductor field effect transistors. Microelectron. Reliab. 41(2): 169-177 (2001) - [c1]Wei Li, Qiang Li, J. S. Yuan, Joshua McConkey, Yuan Chen, Sundar Chetlur, Jonathan Zhou, A. S. Oates:
Hot-carrier-Induced Circuit Degradation for 0.18 µm CMOS Technology. ISQED 2001: 284-289
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-24 23:09 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
