"Percolation defect nucleation and growth as a description of the ..."

Yi Ching Ong, Shou-Chung Lee, A. S. Oates (2018)

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DOI: 10.1109/IRPS.2018.8353667

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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Yi Ching Ong, Shou-Chung Lee, A. S. Oates:
Percolation defect nucleation and growth as a description of the statistics of electrical breakdown for gate, MOL and BEOL dielectrics. IRPS 2018: 7-1

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