"Reliability analysis of pHEMT power amplifier with an on-chip linearizer."

J.-S. Yuan et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.02.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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J.-S. Yuan, Y. Wang, J. Steighner, H.-D. Yen, S.-L. Jang, G.-W. Huang, W.-K. Yeh:
Reliability analysis of pHEMT power amplifier with an on-chip linearizer. Microelectron. Reliab. 53(6): 878-884 (2013)

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