"Dynamic stress-induced high-frequency noise degradations in nMOSFETs."

Chuanzhao Yu, J. S. Yuan, Anwar Sadat (2005)

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DOI: 10.1016/J.MICROREL.2005.07.096

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chuanzhao Yu, J. S. Yuan, Anwar Sadat:
Dynamic stress-induced high-frequency noise degradations in nMOSFETs. Microelectron. Reliab. 45(9-11): 1794-1799 (2005)

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