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ORCIDPranab K. Nag
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2010 – 2019
- 2017
[j2]Ronald Shawn Blanton
, Fa Wang, Cheng Xue, Pranab K. Nag, Yang Xue, Xin Li:
DFM Evaluation Using IC Diagnosis Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(3): 463-474 (2017)- 2013
- [c11]Ronald D. Blanton, Fa Wang, Cheng Xue, Pranab K. Nag, Yang Xue, Xin Li:
DREAMS: DFM rule EvAluation using manufactured silicon. ICCAD 2013: 99-106
2000 – 2009
- 2002
- [j1]Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly:
Modeling the Economics of Testing: A DFT Perspective. IEEE Des. Test Comput. 19(1): 29-41 (2002) - 2000
- [c10]Peng Li, Pranab K. Nag, Wojciech Maly:
Cost based tradeoff analysis of standard cell designs. SLIP 2000: 129-135
1990 – 1999
- 1998
- [c9]Wojciech Maly, Pranab K. Nag, Hans T. Heineken, Jitendra Khare:
Design-Manufacturing Interface: Part I - Vision. DATE 1998: 550-556 - [c8]Wojciech Maly, Pranab K. Nag, Charles H. Ouyang, Hans T. Heineken, Jitendra Khare, P. Simon:
Design-Manufacturing Interface: Part II - Applications. DATE 1998: 557-562 - 1997
- [c7]Hans T. Heineken, Jitendra Khare, Wojciech Maly, Pranab K. Nag, Charles H. Ouyang, Witold A. Pleskacz:
CAD at the Design-Manufacturing Interface. DAC 1997: 321-326 - [c6]Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly:
To DFT or Not to DFT? ITC 1997: 557-566 - 1996
- [c5]Wojciech Maly, Hans T. Heineken, Jitendra Khare, Pranab K. Nag:
Design for manufacturability in submicron domain. ICCAD 1996: 690-697 - 1995
- [c4]Igor Bubel, Wojciech Maly, Thomas Waas, Pranab K. Nag, Hans Hartmann, Doris Schmitt-Landsiedel, Susanne Griep:
AFFCCA: a tool for critical area analysis with circular defects and lithography deformed layout. DFT 1995: 10-18 - [c3]Pranab K. Nag, Wojciech Maly:
Hierarchical extraction of critical area for shorts in very large ICs. DFT 1995: 19-27 - [c2]Jitendra Khare, Sujoy Mitra, Pranab K. Nag, U. Maly, Rob A. Rutenbar:
Testability-oriented channel routing. VLSI Design 1995: 208-213
1980 – 1989
- 1988
- [c1]Wojciech Maly, Pranab K. Nag, Phil Nigh:
Testing oriented analysis of CMOS ICs with opens. ICCAD 1988: 344-347
Coauthor Index
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