"Testing oriented analysis of CMOS ICs with opens."

Wojciech Maly, Pranab K. Nag, Phil Nigh (1988)

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DOI: 10.1109/ICCAD.1988.122525

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Wojciech Maly, Pranab K. Nag, Phil Nigh:
Testing oriented analysis of CMOS ICs with opens. ICCAD 1988: 344-347

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