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Andres F. Gomez

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2010 – 2019

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2019
[j5]
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Andres F. Gomez, Víctor H. Champac:
An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects. J. Electron. Test. 35(1): 87-100 (2019)
2018
[j4]
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Andres F. Gomez, Víctor H. Champac:
Selection of Critical Paths for Reliable Frequency Scaling under BTI-Aging Considering Workload Uncertainty and Process Variations Effects. ACM Trans. Design Autom. Electr. Syst. 23(3): 27:1-27:21 (2018)
[c9]
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Andres F. Gomez, Roberto Gómez, Víctor H. Champac:
A metric-guided gate-sizing methodology for aging guardband reduction. LATS 2018: 1-6
[c8]
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Andres F. Gomez, Freddy Forero, Kaushik Roy, Víctor H. Champac:
Robust Detection of Bridge Defects in STT-MRAM Cells Under Process Variations. VLSI-SoC 2018: 65-70
[c7]
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Víctor H. Champac, Andres F. Gomez, Freddy Forero, Kaushik Roy:
Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection. VLSI-SoC (Selected Papers) 2018: 207-231
2016
[j3]
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  - journals/jolpe/ForeroGC16
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Freddy Forero, Andres F. Gomez, Víctor H. Champac:
Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage. J. Low Power Electron. 12(4): 395-402 (2016)
[j2]
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Andres F. Gomez, Felipe Lavratti, Guilherme Medeiros Machado, M. Sartori, Letícia Maria Veiras Bolzani, Víctor H. Champac, Fabian Vargas:
Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations. Microelectron. Reliab. 67: 150-158 (2016)
[j1]
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Andres F. Gomez, Víctor H. Champac:
Early Selection of Critical Paths for Reliable NBTI Aging-Delay Monitoring. IEEE Trans. Very Large Scale Integr. Syst. 24(7): 2438-2448 (2016)
[c6]
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Andres F. Gomez, Víctor H. Champac:
Critical path selection under NBTI/PBTI aging for adaptive frequency tuning. EWDTS 2016: 1-4
[c5]
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Freddy Forero, Andres F. Gomez, Víctor H. Champac:
A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage. LATS 2016: 81-86
2015
[c4]
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Andres F. Gomez, Víctor H. Champac:
Effective selection of favorable gates in BTI-critical paths to enhance circuit reliability. LATS 2015: 1-6
[c3]
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Víctor H. Champac, Alejandra Nicte-ha Reyes, Andres F. Gomez:
Circuit performance optimization for local intra-die process variations using a gate selection metric. VLSI-SoC 2015: 165-170
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Andres F. Gomez, Víctor H. Champac:
A new sizing approach for lifetime improvement of nanoscale digital circuits due to BTI aging. VLSI-SoC 2015: 297-302
[c1]
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  - conf/vts/GomezPVC15
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Andres F. Gomez, Leticia B. Poehls, Fabian Vargas, Víctor H. Champac:
An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging. VTS 2015: 1-6

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