"A methodology for NBTI circuit reliability at reduced power consumption ..."

Freddy Forero, Andres F. Gomez, Víctor H. Champac (2016)

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DOI: 10.1109/LATW.2016.7483344

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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Freddy Forero, Andres F. Gomez, Víctor H. Champac:
A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage. LATS 2016: 81-86

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