"Effectiveness of a hardware-based approach to detect resistive-open ..."

Andres F. Gomez et al. (2016)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2016.10.012

access: closed

type: Journal Article

metadata version: 2023-08-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/GomezLMSBCV16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/GomezLMSBCV16
Andres F. Gomez, Felipe Lavratti, Guilherme Medeiros Machado, M. Sartori, Letícia Maria Veiras Bolzani, Víctor H. Champac, Fabian Vargas:
Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations. Microelectron. Reliab. 67: 150-158 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.