"Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and ..."

Víctor H. Champac et al. (2018)

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DOI: 10.1007/978-3-030-23425-6_11

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-05

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Víctor H. Champac, Andres F. Gomez, Freddy Forero, Kaushik Roy:
Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection. VLSI-SoC (Selected Papers) 2018: 207-231

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