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ORCIDAbhishek Koneru
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Journal Articles
- 2020
[j5]Abhishek Koneru
, Krishnendu Chakrabarty:
An Interlayer Interconnect BIST and Diagnosis Solution for Monolithic 3-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 3056-3066 (2020)- 2019
- [j4]Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty:
A Design-for-Test Solution Based on Dedicated Test Layers and Test Scheduling for Monolithic 3-D Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(10): 1942-1955 (2019) - 2018
- [j3]Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(5): 1064-1075 (2018) - 2017
- [j2]Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty:
Impact of Electrostatic Coupling and Wafer-Bonding Defects on Delay Testing of Monolithic 3D Integrated Circuits. ACM J. Emerg. Technol. Comput. Syst. 13(4): 54:1-54:23 (2017) - 2015
- [j1]Qing Duan, Abhishek Koneru, Jun Zeng, Krishnendu Chakrabarty, Gary Dispoto:
Accurate Analysis and Prediction of Enterprise Service-Level Performance. ACM Trans. Design Autom. Electr. Syst. 20(4): 52:1-52:23 (2015)
Conference and Workshop Papers
- 2019
- [c11]Abhishek Koneru, Krishnendu Chakrabarty:
Test and Design-for-Testability Solutions for Monolithic 3D Integrated Circuits. ACM Great Lakes Symposium on VLSI 2019: 457-462 - [c10]Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty:
Reliable Power Delivery and Analysis of Power-Supply Noise During Testing in Monolithic 3D ICs. VTS 2019: 1-6 - 2018
- [c9]Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty:
Power-Supply Noise Analysis for Monolithic 3D ICs Using Electrical and Thermal Co-Simulation. ICECS 2018: 217-220 - [c8]Abhishek Koneru, Krishnendu Chakrabarty:
An inter-layer interconnect BIST solution for monolithic 3D ICs. VTS 2018: 1-6 - 2017
- [c7]Kyungwook Chang, Abhishek Koneru, Krishnendu Chakrabarty, Sung Kyu Lim:
Design automation and testing of monolithic 3D ICs: Opportunities, challenges, and solutions: (Invited paper). ICCAD 2017: 805-810 - [c6]Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty:
A Design-for-Test Solution for Monolithic 3D Integrated Circuits. ICCD 2017: 685-688 - 2016
- [c5]Abhishek Koneru, Krishnendu Chakrabarty:
Analysis of electrostatic coupling in monolithic 3D integrated circuits and its impact on delay testing. ETS 2016: 1-6 - [c4]Arunkumar Vijayan, Abhishek Koneru, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Online soft-error vulnerability estimation for memory arrays. VTS 2016: 1-6 - 2015
- [c3]Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Re-using BIST for circuit aging monitoring. ETS 2015: 1-2 - [c2]Abhishek Koneru, Arunkumar Vijayan, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Fine-Grained Aging Prediction Based on the Monitoring of Run-Time Stress Using DfT Infrastructure. ICCAD 2015: 51-58 - [c1]Mehdi Baradaran Tahoori, Abhijit Chatterjee, Krishnendu Chakrabarty, Abhishek Koneru, Arunkumar Vijayan, Debashis Banerjee:
Self-awareness and self-learning for resiliency in real-time systems. IOLTS 2015: 128-131
Informal and Other Publications
- 2022
- [i1]Mino Woo, Terry Jordan, Robert Schreiber, Ilya Sharapov, Shaheer Muhammad, Abhishek Koneru, Michael James, Dirk Van Essendelft:
Disruptive Changes in Field Equation Modeling: A Simple Interface for Wafer Scale Engines. CoRR abs/2209.13768 (2022)
Coauthor Index
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