"Analysis of electrostatic coupling in monolithic 3D integrated circuits ..."

Abhishek Koneru, Krishnendu Chakrabarty (2016)

> Home

Details and statistics

DOI: 10.1109/ETS.2016.7519292

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ets/KoneruC16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ets/KoneruC16
Abhishek Koneru, Krishnendu Chakrabarty:
Analysis of electrostatic coupling in monolithic 3D integrated circuits and its impact on delay testing. ETS 2016: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.