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Books and Theses
- 2014
[b1]Fangming Ye:
Knowledge-Driven Board-Level Functional Fault Diagnosis. Duke University, Durham, NC, USA, 2014
Journal Articles
- 2021
- [j12]Mengyun Liu, Fangming Ye, Xin Li, Krishnendu Chakrabarty
, Xinli Gu:
Board-Level Functional Fault Identification Using Streaming Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(9): 1920-1933 (2021) - 2020
- [j11]Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Fine-grained Adaptive Testing Based on Quality Prediction. ACM Trans. Design Autom. Electr. Syst. 25(5): 38:1-38:25 (2020) - 2016
- [j10]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Adaptive Board-Level Functional Fault Diagnosis Using Incremental Decision Trees. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(2): 323-336 (2016) - [j9]Fangming Ye, Farshad Firouzi, Yang Yang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
On-Chip Droop-Induced Circuit Delay Prediction Based on Support-Vector Machines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(4): 665-678 (2016) - [j8]Shi Jin, Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(6): 985-998 (2016) - 2015
- [j7]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Information-Theoretic Syndrome Evaluation, Statistical Root-Cause Analysis, and Correlation-Based Feature Selection for Guiding Board-Level Fault Diagnosis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(6): 1014-1026 (2015) - [j6]Farshad Firouzi, Fangming Ye, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Aging- and Variation-Aware Delay Monitoring Using Representative Critical Path Selection. ACM Trans. Design Autom. Electr. Syst. 20(3): 39:1-39:23 (2015) - 2014
- [j5]Fangming Ye, Krishnendu Chakrabarty, Zhaobo Zhang, Xinli Gu:
Information-Theoretic Framework for Evaluating and Guiding Board-Level Functional-Fault Diagnosis. IEEE Des. Test 31(3): 65-75 (2014) - [j4]Krishnendu Chakrabarty, Mukesh Agrawal, Sergej Deutsch, Brandon Noia, Ran Wang, Fangming Ye:
Test and Design-for-Testability Solutions for 3D Integrated Circuits. Inf. Media Technol. 9(4): 386-403 (2014) - [j3]Krishnendu Chakrabarty, Mukesh Agrawal, Sergej Deutsch, Brandon Noia, Ran Wang, Fangming Ye:
Test and Design-for-Testability Solutions for 3D Integrated Circuits. IPSJ Trans. Syst. LSI Des. Methodol. 7: 56-73 (2014) - [j2]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Board-Level Functional Fault Diagnosis Using Multikernel Support Vector Machines and Incremental Learning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(2): 279-290 (2014) - 2013
- [j1]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Board-Level Functional Fault Diagnosis Using Artificial Neural Networks, Support-Vector Machines, and Weighted-Majority Voting. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(5): 723-736 (2013)
Conference and Workshop Papers
- 2019
- [c15]Mengyun Liu, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Board-Level Functional Fault Identification using Streaming Data. VTS 2019: 1-6 - 2018
- [c14]Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Fine-Grained Adaptive Testing Based on Quality Prediction. ITC 2018: 1-10 - 2015
- [c13]Fangming Ye, Krishnendu Chakrabarty, Zhaobo Zhang, Xinli Gu:
Self-learning and adaptive board-level functional fault diagnosis. ASP-DAC 2015: 294-301 - [c12]Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Re-using BIST for circuit aging monitoring. ETS 2015: 1-2 - 2014
- [c11]Farshad Firouzi, Fangming Ye, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Adaptive Mitigation of Parameter Variations. ATS 2014: 51-56 - [c10]Farshad Firouzi, Fangming Ye, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Chip Health Monitoring Using Machine Learning. ISVLSI 2014: 280-283 - [c9]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Knowledge discovery and knowledge transfer in board-level functional fault diagnosis. ITC 2014: 1-10 - [c8]Fangming Ye, Farshad Firouzi, Yang Yang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
On-chip voltage-droop prediction using support-vector machines. VTS 2014: 1-6 - 2013
- [c7]Fangming Ye, Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis. Asian Test Symposium 2013: 73-78 - [c6]Li Jiang, Fangming Ye, Qiang Xu, Krishnendu Chakrabarty, Bill Eklow:
On effective and efficient in-field TSV repair for stacked 3D ICs. DAC 2013: 74:1-74:6 - [c5]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis. ETS 2013: 1-6 - [c4]Farshad Firouzi, Fangming Ye, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Representative critical-path selection for aging-induced delay monitoring. ITC 2013: 1-10 - 2012
- [c3]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees. Asian Test Symposium 2012: 202-207 - [c2]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines. Asian Test Symposium 2012: 208-213 - [c1]Fangming Ye, Krishnendu Chakrabarty:
TSV open defects in 3D integrated circuits: characterization, test, and optimal spare allocation. DAC 2012: 1024-1030
Editorship
- 2019
- [e1]Farshad Firouzi, Krishnendu Chakrabarty, Bahar J. Farahani, Fangming Ye, Vasilis F. Pavlidis:
Proceedings of the International Conference on Omni-Layer Intelligent Systems, COINS 2019, Crete, Greece, May 5-7, 2019. ACM 2019, ISBN 978-1-4503-6640-3 [contents]
Coauthor Index
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