"Test and Design-for-Testability Solutions for 3D Integrated Circuits."

Krishnendu Chakrabarty et al. (2014)

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DOI: 10.11185/IMT.9.386

access: closed

type: Journal Article

metadata version: 2024-08-27

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Krishnendu Chakrabarty, Mukesh Agrawal, Sergej Deutsch, Brandon Noia, Ran Wang, Fangming Ye:
Test and Design-for-Testability Solutions for 3D Integrated Circuits. Inf. Media Technol. 9(4): 386-403 (2014)

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