"Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of ..."

Arunkumar Vijayan et al. (2018)

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DOI: 10.1109/TCAD.2016.2620903

access: closed

type: Journal Article

metadata version: 2022-01-03

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Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(5): 1064-1075 (2018)

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