default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDIslam A. K. M. Mahfuzul
Person information
- affiliation: Kyoto University, Department of Electrical Engineering, Graduate School of Engineering, Japan
Other persons with the same name
- Mahfuzul Islam — disambiguation page
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
Books and Theses
- 2014
[b1]Islam A. K. M. Mahfuzul:
Modeling, Characterization and Compensation of Performance Variability using On-chip Monitor Circuits for Energy-efficient LSI. Kyoto University, Japan, 2014
Journal Articles
- 2024
- [j9]Takehiro Kitamura, Takashi Hisakado, Osami Wada, Mahfuzul Islam:
Design of Reference-free Flash ADC With On-chip Rank-based Comparator Selection Using Multiple Comparator Groups. IPSJ Trans. Syst. LSI Des. Methodol. 17: 36-43 (2024) - 2022
- [j8]Takehiro Kitamura, Mahfuzul Islam
, Takashi Hisakado, Osami Wada:
Order Statistics Based Low-Power Flash ADC with On-Chip Comparator Selection. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 105-A(11): 1450-1457 (2022) - [j7]Shun Yamaguchi, Mahfuzul Islam, Takashi Hisakado, Osami Wada:
Low-Power Design of Digital LDO With Nonlinear Symmetric Frequency Generation. IEEE Trans. Circuits Syst. II Express Briefs 69(12): 4644-4648 (2022) - 2019
- [j6]A. K. M. Mahfuzul Islam, Hidetoshi Onodera:
Circuit Techniques for Device-Circuit Interaction toward Minimum Energy Operation. IPSJ Trans. Syst. LSI Des. Methodol. 12: 2-12 (2019) - [j5]Teruki Someya, A. K. M. Mahfuzul Islam, Takayasu Sakurai, Makoto Takamiya:
An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage. IEEE J. Solid State Circuits 54(3): 613-622 (2019) - 2018
- [j4]Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, Tarek Bin Zahid, A. K. M. Mahfuzul Islam, Md. Atiqur Rahman Ahad:
Feature Extraction, Performance Analysis and System Design Using the DU Mobility Dataset. IEEE Access 6: 44776-44786 (2018) - 2017
- [j3]Islam A. K. M. Mahfuzul, Masamune Hamamatsu, Tomoyuki Yokota, Sunghoon Lee, Wakako Yukita, Makoto Takamiya, Takao Someya, Takayasu Sakurai:
Programmable Neuron Array Based on a 2-Transistor Multiplier Using Organic Floating-Gate for Intelligent Sensors. IEEE J. Emerg. Sel. Topics Circuits Syst. 7(1): 81-91 (2017) - 2015
- [j2]Islam A. K. M. Mahfuzul, Jun Shiomi, Tohru Ishihara, Hidetoshi Onodera:
Wide-Supply-Range All-Digital Leakage Variation Sensor for On-Chip Process and Temperature Monitoring. IEEE J. Solid State Circuits 50(11): 2475-2490 (2015) - 2013
- [j1]Islam A. K. M. Mahfuzul, Hidetoshi Onodera:
On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation. IEICE Trans. Inf. Syst. 96-D(9): 1971-1979 (2013)
Conference and Workshop Papers
- 2023
- [c21]Shun Yamaguchi, Mahfuzul Islam, Takashi Hisakado, Osami Wada:
A Fully Synchronous Digital LDO with Built-in Adaptive Frequency Modulation and Implicit Dead-Zone Control. ASP-DAC 2023: 186-187 - [c20]Mahfuzul Islam, Takehiro Kitamura, Takashi Hisakado, Osami Wada:
Demonstration of Order Statistics Based Flash ADC in a 65nm Process. ASP-DAC 2023: 188-189 - [c19]Shun Yamaguchi, Takashi Hisakado, Osami Wada, Mahfuzul Islam:
An Adaptive-Sampling Digital LDO with Statistical Comparator Selection Achieving 99.99% Maximum Current Efficiency and 0.25ps FoM in 65nm. A-SSCC 2023: 1-3 - [c18]Mahfuzul Islam, Shogo Harada, Takashi Hisakado, Osami Wada:
CMOS Temperature Sensor Utilizing Gate-length-based Threshold Voltage Modulation. NEWCAS 2023: 1-5 - 2022
- [c17]Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, Osami Wada:
Performance Improvement of Order Statistics Based Flash ADC Using Multiple Comparator Groups. NEWCAS 2022: 1-4 - 2021
- [c16]Shogo Harada, Mahfuzul Islam, Takashi Hisakado, Osami Wada:
A process scalable voltage-reference-free temperature sensor utilizing MOSFET threshold voltage variation. A-SSCC 2021: 1-3 - [c15]Kensuke Murakami, Mahfuzul Islam, Hidetoshi Onodera:
CDF Distance Based Statistical Parameter Extraction Using Nonlinear Delay Variation Models. IOLTS 2021: 1-6 - [c14]Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, Osami Wada:
Flash ADC Utilizing Offset Voltage Variation With Order Statistics Based Comparator Selection. ISQED 2021: 103-108 - 2019
- [c13]Koutaro Miyazaki, Yang Lo, A. K. M. Mahfuzul Islam, Katsuhiro Hata, Makoto Takamiya, Takayasu Sakurai:
CNN-based Approach for Estimating Degradation of Power Devices by Gate Waveform Monitoring. ICICDT 2019: 1-4 - [c12]A. K. M. Mahfuzul Islam, Ryota Shimizu, Hidetoshi Onodera:
Analysis of Random Telegraph Noise (RTN) at Near-Threshold Operation by Measuring 154k Ring Oscillators. IRPS 2019: 1-6 - [c11]A. K. M. Mahfuzul Islam, Shinichi Nishizawa, Yusuke Matsui, Yoshinobu Ichida:
Drive-Strength Selection for Synthesis of Leakage-Dominant Circuits. ISQED 2019: 298-303 - 2018
- [c10]Teruki Someya, Islam A. K. M. Mahfuzul, Takayasu Sakurai, Makoto Takamiya:
A 13nW temperature-to-digital converter utilizing sub-threshold MOSFET operation at sub-thermal drain voltage. CICC 2018: 1-4 - [c9]A. K. M. Mahfuzul Islam, Hidetoshi Onodera:
PVT2: process, voltage, temperature and time-dependent variability in scaled CMOS process. ICCAD 2018: 126 - [c8]A. K. M. Mahfuzul Islam, Hidetoshi Onodera:
Worst-Case Performance Analysis Under Random Telegraph Noise Induced Threshold Voltage Variability. PATMOS 2018: 140-146 - 2017
- [c7]Islam A. K. M. Mahfuzul, Hidetoshi Onodera:
Effect of supply voltage on random telegraph noise of transistors under switching condition. PATMOS 2017: 1-8 - 2016
- [c6]Islam A. K. M. Mahfuzul, Hidetoshi Onodera:
On-chip monitoring and compensation scheme with fine-grain body biasing for robust and energy-efficient operations. ASP-DAC 2016: 403-409 - 2015
- [c5]Norihiro Kamae, Islam A. K. M. Mahfuzul, Akira Tsuchiya, Tohru Ishihara, Hidetoshi Onodera:
Energy reduction by built-in body biasing with single supply voltage operation. ISQED 2015: 181-185 - 2014
- [c4]Islam A. K. M. Mahfuzul, Jun Shiomi, Tohru Ishihara, Hidetoshi Onodera:
Wide-supply-range all-digital leakage variation sensor for on-chip process and temperature monitoring. A-SSCC 2014: 45-48 - [c3]Norihiro Kamae, Islam A. K. M. Mahfuzul, Akira Tsuchiya, Hidetoshi Onodera:
A body bias generator with wide supply-range down to threshold voltage for within-die variability compensation. A-SSCC 2014: 53-56 - [c2]Islam A. K. M. Mahfuzul, Hidetoshi Onodera:
Characterization and compensation of performance variability using on-chip monitors. VLSI-DAT 2014: 1-4 - 2012
- [c1]Islam A. K. M. Mahfuzul, Hidetoshi Onodera:
On-Chip Detection of Process Shift and Process Spread for Silicon Debugging and Model-Hardware Correlation. Asian Test Symposium 2012: 350-354
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-11-20 21:56 CET by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
