"CNN-based Approach for Estimating Degradation of Power Devices by Gate ..."

Koutaro Miyazaki et al. (2019)

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DOI: 10.1109/ICICDT.2019.8790833

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-07

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Koutaro Miyazaki, Yang Lo, A. K. M. Mahfuzul Islam, Katsuhiro Hata, Makoto Takamiya, Takayasu Sakurai:
CNN-based Approach for Estimating Degradation of Power Devices by Gate Waveform Monitoring. ICICDT 2019: 1-4

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