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ORCIDChristian Russ
This is just a disambiguation page, and is not intended to be the bibliography of an actual person. The links to all actual bibliographies of persons of the same or a similar name can be found below. Any publication listed on this page has not been assigned to an actual author yet. If you know the true author of one of the publications listed below, you are welcome to contact us.
Person information
Other persons with the same name
- Christian Russ 0001 (aka: Christian Ruß 0001) — Saarland University, Saarbrücken, Germany (and 2 more)
- Christian Russ 0002 — ConfigWorks GmbH, Klagenfurt, Austria (and 1 more)
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2020 – today
- 2024
[j7]Christian Russ
, Philipp Stalder, Stefanie Rufinatscha, Tibor Pimentel, Lukas Geissmann:
Auswirkungen der Medizinprodukteverordnung auf ML-Lösungen in Schweizer Spitälern. HMD Prax. Wirtsch. 61(2): 503-518 (2024)- 2023
- [j6]Katja Kurz, Ninja Leikert-Boehm, Christian Russ, Marcel Roland Sieber:
Steigerung der Innovationskraft einer Schweizer Stiftung - IdéeSport's Transformation zu einer agilen Organisation. HMD Prax. Wirtsch. 60(3): 679-691 (2023) - [j5]Christian Russ, Philipp Stalder, Joachim Steinwendner, Tibor Pimentel, James Kavakopoulos:
Anforderungen an eine iPaaS Cloud Lösung zum sicheren Betrieb von Gesundheitsdaten in Schweizer Spitälern. HMD Prax. Wirtsch. 60(5): 1047-1061 (2023)
2010 – 2019
- 2017
- [c5]Milova Paul, Christian Russ, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava:
Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete? VLSID 2017: 391-394
2000 – 2009
- 2009
- [j4]David Alvarez, Kiran V. Chatty, Christian Russ, Michel J. Abou-Khalil, Junjun Li, Robert Gauthier, Kai Esmark, Ralph Halbach, Christopher Seguin:
Design optimization of gate-silicided ESD NMOSFETs in a 45 nm bulk CMOS technology. Microelectron. Reliab. 49(12): 1417-1423 (2009) - 2008
- [j3]Christian Russ:
ESD issues in advanced CMOS bulk and FinFET technologies: Processing, protection devices and circuit strategies. Microelectron. Reliab. 48(8-9): 1403-1411 (2008) - [c4]Christian Russ, Mathias Lux:
A Model of Self-organized Criticality in Emergent Web Systems. UNISCON 2008: 496-507 - 2007
- [j2]Ulrich Glaser, Kai Esmark, Martin Streibl, Christian Russ, Krzysztof Domanski, Mauro Ciappa, Wolfgang Fichtner:
SCR operation mode of diode strings for ESD protection. Microelectron. Reliab. 47(7): 1044-1053 (2007) - [c3]Michael Fulde, Klaus von Arnim, Christian Pacha, Florian Bauer, Christian Russ, Domagoj Siprak, Wade Xiong, Andrew Marshall, C. Rinn Cleavelin, Klaus Schruefer, Doris Schmitt-Landsiedel, Gerhard Knoblinger:
Advances in Multi-Gate MOSFET Circuit Design. ICECS 2007: 186-189 - [c2]Andrew Marshall, C. Rinn Cleavelin, Weize Xiong, Christian Pacha, Gerhard Knoblinger, Klaus Von Armin, Thomas Schulz, Klaus Schruefer, Ken Matthews, Wolfgang Molzer, Paul Patruno, Christian Russ:
A merged MuGFET and planar SOI process. SoCC 2007: 39-42 - 2006
- [j1]David Alvarez, Michel J. Abou-Khalil, Christian Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, Junjun Li, Christopher Seguin, Ralph Halbach:
Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectron. Reliab. 46(9-11): 1597-1602 (2006) - [c1]Christian Pacha, Klaus von Arnim, Thomas Schulz, Weize Xiong, Michael Gostkowski, Gerhard Knoblinger, Andrew Marshall, Thomas Nirschl, Jörg Berthold, Christian Russ, Harald Gossner, Charvaka Duvvury, Paul Patruno, C. Rinn Cleavelin, Klaus Schruefer:
Circuit design issues in multi-gate FET CMOS technologies. ISSCC 2006: 1656-1665
Coauthor Index
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