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Ralph Halbach

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2000 – 2009

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2009
[j2]
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  - journals/mr/AlvarezCRALGEHS09
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  - https://dblp.org/rec/journals/mr/AlvarezCRALGEHS09
David Alvarez, Kiran V. Chatty, Christian Russ, Michel J. Abou-Khalil, Junjun Li, Robert Gauthier, Kai Esmark, Ralph Halbach, Christopher Seguin:
Design optimization of gate-silicided ESD NMOSFETs in a 45 nm bulk CMOS technology. Microelectron. Reliab. 49(12): 1417-1423 (2009)
2006
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David Alvarez, Michel J. Abou-Khalil, Christian Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, Junjun Li, Christopher Seguin, Ralph Halbach:
Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectron. Reliab. 46(9-11): 1597-1602 (2006)

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