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2020 – today
- 2022
[j83]Cedric Busschots
, Johan Pattyn, Dries Peumans, Yves Rolain, Gerd Vandersteen:
Forced Oscillation Technique Measurement Apparatus Using Fan-Speaker Hybrid. IEEE Trans. Instrum. Meas. 71: 1-9 (2022)- 2021
- [j82]Cedric Busschots, Andy Keymolen, Sylvia Verbanck, Daniël Schuermans, Hannes Maes, Dries Peumans, Johan Pattyn, Yves Rolain, Gerd Vandersteen, John Lataire:
Adaptive Excitation Signals for Low-Frequency Forced Oscillation Technique Measurements in Patients. IEEE Trans. Instrum. Meas. 70: 1-9 (2021)
2010 – 2019
- 2018
- [j81]Mark Vaes, Yves Rolain, Johan Pattyn, Gerd Vandersteen:
Experimentally driven demystification of system identification for nonlinear mechanical systems. IEEE Instrum. Meas. Mag. 21(2): 16-25 (2018) - [j80]Adam Cooman, Piet Bronders, Dries Peumans, Gerd Vandersteen, Yves Rolain:
Distortion Contribution Analysis With the Best Linear Approximation. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(12): 4133-4146 (2018) - [i4]Maarten Schoukens, Gerd Vandersteen, Yves Rolain, Francesco Ferranti:
Fast Identification of Wiener-Hammerstein Systems using Discrete Optimization. CoRR abs/1804.07034 (2018) - [i3]Johan Schoukens, Rik Pintelon, Yves Rolain, Maarten Schoukens, Koen Tiels, Laurent Vanbeylen, Anne Van Mulders, Gerd Vandersteen:
Structure Discrimination in Block-Oriented Models Using Linear Approximations: A Theoretic Framework. CoRR abs/1804.09648 (2018) - 2017
- [i2]Maarten Schoukens, Anna Marconato, Rik Pintelon, Gerd Vandersteen, Yves Rolain:
Parametric identification of parallel Wiener-Hammerstein systems. CoRR abs/1708.06543 (2017) - 2016
- [c25]Matthias Caenepeel, Francesco Ferranti, Yves Rolain:
Efficient and automated generation of multidimensional design curves for coupled-resonator filters using system identification and metamodels. SMACD 2016: 1-4 - [i1]Adam Cooman, Piet Bronders, Dries Peumans, Gerd Vandersteen, Yves Rolain:
Distortion Contribution Analysis with the Best Linear Approximation. CoRR abs/1610.08332 (2016) - 2015
- [j79]Maarten Schoukens, Anna Marconato, Rik Pintelon, Gerd Vandersteen, Yves Rolain:
Parametric identification of parallel Wiener-Hammerstein systems. Autom. 51: 111-122 (2015) - [j78]Johan Schoukens, Rik Pintelon, Yves Rolain, Maarten Schoukens, Koen Tiels, Laurent Vanbeylen, Anne Van Mulders, Gerd Vandersteen:
Structure discrimination in block-oriented models using linear approximations: A theoretic framework. Autom. 53: 225-234 (2015) - [c24]Francesco Ferranti, Yves Rolain:
A local approach for the modeling of linear parameter-varying systems based on transfer function interpolation with scaling coefficients. I2MTC 2015: 606-611 - [c23]Laurent Baratchart, Matthias Caenepeel, Yves Rolain:
Wiener-Hammerstein systems and harmonic identification. I2MTC 2015: 612-617 - 2014
- [j77]Maarten Schoukens, Rik Pintelon, Yves Rolain:
Identification of Wiener-Hammerstein systems by a nonparametric separation of the best linear approximation. Autom. 50(2): 628-634 (2014) - [c22]Johan Schoukens, Anna Marconato, Rik Pintelon, Yves Rolain, Maarten Schoukens, Koen Tiels, Laurent Vanbeylen, Gerd Vandersteen, Anne Van Mulders:
System identification in a real world. AMC 2014: 1-9 - 2013
- [j76]Johan Schoukens, Gerd Vandersteen, Rik Pintelon, Zlatko Emedi, Yves Rolain:
Bounding the Polynomial Approximation Errors of Frequency Response Functions. IEEE Trans. Instrum. Meas. 62(5): 1346-1353 (2013) - [j75]Egon Geerardyn, Yves Rolain, Johan Schoukens:
Design of Quasi-Logarithmic Multisine Excitations for Robust Broad Frequency Band Measurements. IEEE Trans. Instrum. Meas. 62(5): 1364-1372 (2013) - [c21]Johan Schoukens, Yves Rolain, Gerd Vandersteen, Rik Pintelon:
Study of Small Data Set Efficiency Losses in System Identification: The FIR Case. ALCOSP 2013: 68-73 - [c20]Anna Marconato, Maarten Schoukens, Yves Rolain, Johan Schoukens:
Study of the effective number of parameters in nonlinear identification benchmarks. CDC 2013: 4308-4313 - [c19]Maarten Schoukens, Gerd Vandersteen, Yves Rolain:
An identification algorithm for parallel Wiener-Hammerstein systems. CDC 2013: 4907-4912 - 2012
- [j74]Maarten Schoukens, Yves Rolain:
Cross-term Elimination in Parallel Wiener Systems Using a Linear Input Transformation. IEEE Trans. Instrum. Meas. 61(3): 845-847 (2012) - [j73]Wim Foubert, Carine Neus, Leo Van Biesen, Yves Rolain:
Exploiting the Phantom-Mode Signal in DSL Applications. IEEE Trans. Instrum. Meas. 61(4): 896-902 (2012) - [j72]Johan Schoukens, Gerd Vandersteen, Yves Rolain, Rik Pintelon:
Frequency Response Function Measurements Using Concatenated Subrecords With Arbitrary Length. IEEE Trans. Instrum. Meas. 61(10): 2682-2688 (2012) - [j71]Maarten Schoukens, Yves Rolain:
Parametric Identification of Parallel Wiener Systems. IEEE Trans. Instrum. Meas. 61(10): 2825-2832 (2012) - 2011
- [j70]Carine Neus, Wim Foubert, Leo Van Biesen, Yves Rolain, Patrick Boets, Jochen Maes:
Binder Identification by Means of Phantom Measurements. IEEE Trans. Instrum. Meas. 60(6): 1967-1975 (2011) - [j69]Maarten Schoukens, Rik Pintelon, Yves Rolain:
Parametric Identification of Parallel Hammerstein Systems. IEEE Trans. Instrum. Meas. 60(12): 3931-3938 (2011) - [c18]Johan Schoukens, Yves Rolain, Gerd Vandersteen, Rik Pintelon:
User friendly Box-Jenkins identification using nonparametric noise models. CDC/ECC 2011: 2148-2153 - [c17]Maarten Schoukens, Yves Rolain:
Parametric MIMO parallel Wiener identification. CDC/ECC 2011: 5100-5105 - 2010
- [j68]Lynn Bos, Gerd Vandersteen, Pieter Rombouts, Arnd Geis, Alonso Morgado, Yves Rolain, Geert Van der Plas, Julien Ryckaert:
Multirate Cascaded Discrete-Time Low-Pass ΔΣ Modulator for GSM/Bluetooth/UMTS. IEEE J. Solid State Circuits 45(6): 1198-1208 (2010) - [j67]Arnd Geis, Julien Ryckaert, Lynn Bos, Gerd Vandersteen, Yves Rolain, Jan Craninckx:
A 0.5 mm 2 Power-Scalable 0.5-3.8-GHz CMOS DT-SDR Receiver With Second-Order RF Band-Pass Sampler. IEEE J. Solid State Circuits 45(11): 2375-2387 (2010) - [j66]Wim Foubert, Carine Neus, Leo Van Biesen, Yves Rolain:
Modeling the Series Impedance of a Quad Cable for Common-Mode DSL Applications. IEEE Trans. Instrum. Meas. 59(2): 259-265 (2010) - [j65]Johan Schoukens, Tadeusz P. Dobrowiecki, Yves Rolain, Rik Pintelon:
Upper Bounding Variations of Best Linear Approximations of Nonlinear Systems in Power Sweep Measurements. IEEE Trans. Instrum. Meas. 59(5): 1141-1148 (2010) - [j64]Stephane Bronckers, Geert Van der Plas, Gerd Vandersteen, Yves Rolain:
Substrate Noise Coupling Mechanisms in Lightly Doped CMOS Transistors. IEEE Trans. Instrum. Meas. 59(6): 1727-1733 (2010) - [c16]Johan Schoukens, Yves Rolain, Rik Pintelon:
On the use of parametric and non-parametric noise-models in time- and frequency domain system identification. CDC 2010: 316-321 - [c15]Arnd Geis, Pierluigi Nuzzo, Julien Ryckaert, Yves Rolain, Gerd Vandersteen, Jan Craninckx:
An 11.6-19.3mW 0.375-13.6GHz CMOS frequency synthesizer with rail-to-rail operation. DATE 2010: 697-701 - [c14]Piet Wambacq, Vito Giannini, Karen Scheir, Wim Van Thillo, Yves Rolain:
A fifth-order 880MHz/1.76GHz active lowpass filter for 60GHz communications in 40nm digital CMOS. ESSCIRC 2010: 350-353
2000 – 2009
- 2009
- [j63]Jonathan Borremans, Steven Thijs, Piet Wambacq, Yves Rolain, Dimitri Linten, Maarten Kuijk:
A Fully Integrated 7.3 kV HBM ESD-Protected Transformer-Based 4.5-6 GHz CMOS LNA. IEEE J. Solid State Circuits 44(2): 344-353 (2009) - [j62]Stephane Bronckers, Karen Scheir, Geert Van der Plas, Gerd Vandersteen, Yves Rolain:
A Methodology to Predict the Impact of Substrate Noise in Analog/RF Systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(11): 1613-1626 (2009) - [j61]Gerd Vandersteen, Yves Rolain, Koen Vandermot, Rik Pintelon, Johan Schoukens, Wendy Van Moer:
Quasi-Analytical Bit-Error-Rate Analysis Technique Using Best Linear Approximation Modeling. IEEE Trans. Instrum. Meas. 58(2): 475-482 (2009) - [j60]Wendy Van Moer, Yves Rolain:
An Improved Broadband Conversion Scheme for the Large-Signal Network Analyzer. IEEE Trans. Instrum. Meas. 58(2): 483-487 (2009) - [j59]Stephane Bronckers, Gerd Vandersteen, Ludwig De Locht, Michael Libois, Geert Van der Plas, Yves Rolain:
Experimental Analysis of the Coupling Mechanisms Between a 4 GHz PPA and a 5-7 GHz LC -VCO. IEEE Trans. Instrum. Meas. 58(8): 2706-2713 (2009) - [j58]Kurt Barbé, Wendy Van Moer, Yves Rolain:
Using ANOVA in a Microwave Round-Robin Comparison. IEEE Trans. Instrum. Meas. 58(10): 3490-3498 (2009) - [c13]Lynn Bos, Gerd Vandersteen, Julien Ryckaert, Pieter Rombouts, Yves Rolain, Geert Van der Plas:
A multirate 3.4-to-6.8mW 85-to-66dB DR GSM/bluetooth/UMTS cascade DT ΔΣM in 90nm digital CMOS. ISSCC 2009: 176-177 - [c12]Karen Scheir, Gerd Vandersteen, Yves Rolain, Piet Wambacq:
A 57-to-66GHz quadrature PLL in 45nm digital CMOS. ISSCC 2009: 494-495 - 2008
- [j57]Jonathan Borremans, Piet Wambacq, Charlotte Soens, Yves Rolain, Maarten Kuijk:
Low-Area Active-Feedback Low-Noise Amplifier Design in Scaled Digital CMOS. IEEE J. Solid State Circuits 43(11): 2422-2433 (2008) - [j56]Karen Scheir, Stephane Bronckers, Jonathan Borremans, Piet Wambacq, Yves Rolain:
A 52 GHz Phased-Array Receiver Front-End in 90 nm Digital CMOS. IEEE J. Solid State Circuits 43(12): 2651-2659 (2008) - [j55]Yves Rolain, Wendy Van Moer, Johan Schoukens, Tom Dhaene:
Estimation and Validation of Semiparametric Dynamic Nonlinear Models. IEEE Trans. Instrum. Meas. 57(2): 395-400 (2008) - [j54]Wendy Van Moer, Yves Rolain:
Multisine Calibration for Large-Signal Broadband Measurements. IEEE Trans. Instrum. Meas. 57(7): 1478-1483 (2008) - [j53]Johan Schoukens, Liesbeth Gommé, Wendy Van Moer, Yves Rolain:
Identification of a Block-Structured Nonlinear Feedback System, Applied to a Microwave Crystal Detector. IEEE Trans. Instrum. Meas. 57(8): 1734-1740 (2008) - [c11]Karen Scheir, Stephane Bronckers, Jonathan Borremans, Piet Wambacq, Yves Rolain:
A 52GHz Phased-Array Receiver Front-End in 90nm Digital CMOS. ISSCC 2008: 184-185 - 2007
- [j52]Yves Rolain, Wendy Van Moer, Johan Schoukens, Rik Pintelon:
Measuring Nonlinear Differential RF Amplifiers Using One Single-Ended Source. IEEE Trans. Instrum. Meas. 56(3): 1042-1048 (2007) - [j51]Johan Paduart, Johan Schoukens, Yves Rolain:
Fast Measurement of Quantization Distortions in DSP Algorithms. IEEE Trans. Instrum. Meas. 56(5): 1917-1923 (2007) - [j50]Yves Rolain, Wendy Van Moer, Jeffrey A. Jargon, Donald C. DeGroot:
On Peculiarities of S-Parameter Measurements. IEEE Trans. Instrum. Meas. 56(5): 1967-1972 (2007) - [j49]Wendy Van Moer, Yves Rolain:
Determining the Reciprocity of Mixers Through Three-Port Large Signal Network Analyzer Measurements. IEEE Trans. Instrum. Meas. 56(5): 2051-2056 (2007) - [c10]Jonathan Borremans, Ludwig De Locht, Piet Wambacq, Yves Rolain:
Nonlinearity analysis of Analog/RF circuits using combined multisine and volterra analysis. DATE 2007: 261-266 - [c9]Stephane Bronckers, Charlotte Soens, Geert Van der Plas, Gerd Vandersteen, Yves Rolain:
Interactive presentation: Simulation methodology and experimental verification for the analysis of substrate noise on LC-VCO's. DATE 2007: 1520-1525 - [c8]Jonathan Borremans, Piet Wambacq, Geert Van der Plas, Yves Rolain, Maarten Kuijk:
A switchable low-area 2.4-and-5 GHz dual-band LNA in digital CMOS. ESSCIRC 2007: 376-379 - 2006
- [j48]Johan Schoukens, Yves Rolain, Rik Pintelon:
Analysis of windowing/leakage effects in frequency response function measurements. Autom. 42(1): 27-38 (2006) - [j47]Rik Pintelon, Yves Rolain, Johan Schoukens:
Box-Jenkins identification revisited - Part II: Applications. Autom. 42(1): 77-84 (2006) - [j46]Charlotte Soens, Geert Van der Plas, Mustafa Badaroglu, Piet Wambacq, Stéphane Donnay, Yves Rolain, Maarten Kuijk:
Modeling of Substrate Noise Generation, Isolation, and Impact for an LC-VCO and a Digital Modem on a Lightly-Doped Substrate. IEEE J. Solid State Circuits 41(9): 2040-2051 (2006) - [j45]Ludwig De Locht, Gerd Vandersteen, Yves Rolain, Rik Pintelon:
Estimating parameterized scalable models from the best linear approximation of nonlinear systems for accurate high-level simulations. IEEE Trans. Instrum. Meas. 55(4): 1186-1191 (2006) - [j44]Johan Schoukens, Yves Rolain, Rik Pintelon:
Leakage Reduction in Frequency-Response Function Measurements. IEEE Trans. Instrum. Meas. 55(6): 2286-2291 (2006) - [c7]Gerd Vandersteen, Stephane Bronckers, Petr Dobrovolný, Yves Rolain:
Systematic stability-analysis method for analog circuits. DATE 2006: 150-155 - 2005
- [j43]Johan Schoukens, Rik Pintelon, Tadeusz P. Dobrowiecki, Yves Rolain:
Identification of linear systems with nonlinear distortions. Autom. 41(3): 491-504 (2005) - [j42]Adhemar Bultheel, Marc Van Barel, Yves Rolain, Rik Pintelon:
Numerically robust transfer function modeling from noisy frequency domain data. IEEE Trans. Autom. Control. 50(11): 1835-1839 (2005) - [c6]Gerd Vandersteen, Ludwig De Locht, Snezana Jenei, Yves Rolain, Rik Pintelon:
Estimating Scalable Common-Denominator Laplace-Domain MIMO Models in an Errors-in-Variables Framework. DATE 2005: 1076-1081 - 2004
- [j41]Johan Schoukens, Rik Pintelon, Yves Rolain:
Box-Jenkins alike identification using nonparametric noise models. Autom. 40(12): 2083-2089 (2004) - [j40]Yves Rolain, Wendy Van Moer, Gerd Vandersteen, Johan Schoukens:
Why are nonlinear microwave systems measurements so involved? IEEE Trans. Instrum. Meas. 53(3): 726-729 (2004) - [j39]Wendy Van Moer, Yves Rolain:
Measuring the sensitivity of microwave components to bias variations. IEEE Trans. Instrum. Meas. 53(3): 787-791 (2004) - [j38]Yves Rolain, Wendy Van Moer:
Block-oriented instrument software design. IEEE Trans. Instrum. Meas. 53(3): 830-838 (2004) - [j37]Rik Pintelon, Gerd Vandersteen, Ludwig De Locht, Yves Rolain, Johan Schoukens:
Experimental characterization of operational amplifiers: a system identification Approach-part I: theory and Simulations. IEEE Trans. Instrum. Meas. 53(3): 854-862 (2004) - [j36]Rik Pintelon, Yves Rolain, Gerd Vandersteen, Johan Schoukens:
Experimental characterization of operational amplifiers: a system identification approach-part II: calibration and measurements. IEEE Trans. Instrum. Meas. 53(3): 863-876 (2004) - [c5]Johan Schoukens, Rik Pintelon, Yves Rolain:
Time domain identification, frequency domain identification. Equivalencies! Differences? ACC 2004: 661-666 - 2003
- [j35]Johan Schoukens, József G. Nemeth, Philippe Crama, Yves Rolain, Rik Pintelon:
Fast approximate identification of nonlinear systems. Autom. 39(7): 1267-1274 (2003) - [j34]Rik Pintelon, Johan Schoukens, Yves Rolain:
Uncertainty of transfer function modelling using prior estimated noise models. Autom. 39(10): 1721-1733 (2003) - [j33]Rik Pintelon, Yves Rolain, Wendy Van Moer:
Probability density function for frequency response function measurements using periodic signals. IEEE Trans. Instrum. Meas. 52(1): 61-68 (2003) - [j32]Alain Geens, Yves Rolain, Wendy Van Moer, Kenneth Vanhoenacker, Johan Schoukens:
Discussion on fundamental issues of NPR measurements. IEEE Trans. Instrum. Meas. 52(1): 197-202 (2003) - [j31]Johan Schoukens, Yves Rolain, Gyula Simon, Rik Pintelon:
Fully automated spectral analysis of periodic signals. IEEE Trans. Instrum. Meas. 52(4): 1021-1024 (2003) - [j30]Alain Geens, Wendy Van Moer, Yves Rolain:
Measuring in-band distortions of mixers. IEEE Trans. Instrum. Meas. 52(4): 1030-1034 (2003) - [j29]Wendy Van Moer, Yves Rolain:
Proving the usefulness of a three-port nonlinear vectorial network analyzer through mixer measurements. IEEE Trans. Instrum. Meas. 52(6): 1834-1837 (2003) - 2002
- [j28]Johan Schoukens, Yves Rolain, Rik Pintelon:
Modified AIC rule for model selection in combination with prior estimated noise models. Autom. 38(5): 903-906 (2002) - [j27]Wendy Van Moer, Yves Rolain, Johan Schoukens:
An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyzer. IEEE Trans. Instrum. Meas. 51(2): 337-341 (2002) - [j26]Gerd Vandersteen, Alain R. F. Barel, Yves Rolain:
Broadband high-frequency hybrid. IEEE Trans. Instrum. Meas. 51(6): 1204-1209 (2002) - 2001
- [j25]Johan Schoukens, Rik Pintelon, Yves Rolain, Tadeusz P. Dobrowiecki:
Frequency response function measurements in the presence of nonlinear distortions. Autom. 37(6): 939-946 (2001) - [j24]Rudi Vuerinckx, Rik Pintelon, Johan Schoukens, Yves Rolain:
Obtaining accurate confidence regions for the estimated zeros and poles in system identification problems. IEEE Trans. Autom. Control. 46(4): 656-659 (2001) - [j23]Rik Pintelon, Johan Schoukens, Wendy Van Moer, Yves Rolain:
Identification of linear systems in the presence of nonlinear distortions. IEEE Trans. Instrum. Meas. 50(4): 855-863 (2001) - [j22]Yves Rolain, Wendy Van Moer, Gerd Vandersteen, Marc van Heijningen:
Measuring mixed-signal substrate coupling. IEEE Trans. Instrum. Meas. 50(4): 959-964 (2001) - [j21]Alain Geens, Yves Rolain:
Noise figure measurements on nonlinear devices. IEEE Trans. Instrum. Meas. 50(4): 971-975 (2001) - [j20]Wendy Van Moer, Yves Rolain, Rik Pintelon:
Modeling in the presence of switching uncertainties. IEEE Trans. Instrum. Meas. 50(5): 1103-1108 (2001) - [j19]Balázs Vargha, Johan Schoukens, Yves Rolain:
Static nonlinearity testing of digital-to-analog converters. IEEE Trans. Instrum. Meas. 50(5): 1283-1288 (2001) - [j18]Gerd Vandersteen, Yves Rolain, Johan Schoukens:
An identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortions. IEEE Trans. Instrum. Meas. 50(5): 1355-1363 (2001) - [j17]Wendy Van Moer, Yves Rolain, Alain Geens:
Measurement-based nonlinear modeling of spectral regrowth. IEEE Trans. Instrum. Meas. 50(6): 1711-1716 (2001) - [c4]Adhemar Bultheel, Marc Van Barel, Yves Rolain, Johan Schoukens:
Robust rational approximation for identification. CDC 2001: 4770-4775 - [c3]Gerd Vandersteen, Piet Wambacq, Yves Rolain, Johan Schoukens, Stéphane Donnay, Marc Engels, Ivo Bolsens:
Efficient bit-error-rate estimation of multicarrier transceivers. DATE 2001: 164-168 - 2000
- [j16]Rik Pintelon, Johan Schoukens, Yves Rolain:
Box-Jenkins continuous-time modeling. Autom. 36(7): 983-991 (2000) - [j15]Johan Schoukens, Rik Pintelon, Yves Rolain:
Broadband versus stepped sine FRF measurements. IEEE Trans. Instrum. Meas. 49(2): 275-278 (2000) - [c2]Gerd Vandersteen, Piet Wambacq, Yves Rolain, Petr Dobrovolný, Stéphane Donnay, Marc Engels, Ivo Bolsens:
A methodology for efficient high-level dataflow simulation of mixed-signal front-ends of digital telecom transceivers. DAC 2000: 440-445
1990 – 1999
- 1999
- [j14]Johan Schoukens, Rik Pintelon, Yves Rolain:
Study of conditional ML estimators in time and frequency-domain system identification. Autom. 35(1): 91-100 (1999) - [j13]Yves Rolain, Rik Pintelon:
Generating robust starting values for frequency-domain transfer function estimation. Autom. 35(5): 965-972 (1999) - [j12]Rik Pintelon, Johan Schoukens, Gerd Vandersteen, Yves Rolain:
Identification of invariants of (over)parameterized models: finite sample results. IEEE Trans. Autom. Control. 44(5): 1073-1077 (1999) - 1998
- [j11]Rik Pintelon, Patrick Guillaume, Gerd Vandersteen, Yves Rolain:
Analyses, Development, and Applications of TLS Algorithms in Frequency Domain System Identification. SIAM J. Matrix Anal. Appl. 19(4): 983-1004 (1998) - [j10]Johan Schoukens, Yves Rolain, Rik Pintelon:
Improved frequency response function measurements for random noise excitations. IEEE Trans. Instrum. Meas. 47(1): 322-326 (1998) - [j9]Jeroen Strompf, István Kollár, Yves Rolain:
Independent scaling of a delay in frequency-domain system identification. IEEE Trans. Instrum. Meas. 47(1): 327-331 (1998) - [j8]Yves Rolain, Johan Schoukens, Gerd Vandersteen:
Signal reconstruction for non-equidistant finite length sample sets: a "KIS" approach. IEEE Trans. Instrum. Meas. 47(5): 1046-1052 (1998) - [j7]Philip Vael, Yves Rolain, Alain R. F. Barel, Andy Bliki:
Measurements of harmonic distortion produced by a saturated optical amplifier with a nonlinear microwave network analyzer. IEEE Trans. Instrum. Meas. 47(5): 1300-1306 (1998) - 1997
- [j6]Gerd Vandersteen, Yves Rolain, Johan Schoukens:
Non-parametric Estimation of the Frequency-response Functions of the Linear Blocks of a Wiener-Hammerstein Model. Autom. 33(7): 1351-1355 (1997) - [j5]Yves Rolain, Johan Schoukens, Rik Pintelon:
Order estimation for linear time-invariant systems using frequency domain identification methods. IEEE Trans. Autom. Control. 42(10): 1408-1417 (1997) - 1996
- [j4]Rik Pintelon, Johan Schoukens, Tomas McKelvey, Yves Rolain:
Minimum variance bounds for overparameterized models. IEEE Trans. Autom. Control. 41(5): 719-720 (1996) - [j3]Rudi Vuerinckx, Yves Rolain, Johan Schoukens, Rik Pintelon:
Design of stable IIR filters in the complex domain by automatic delay selection. IEEE Trans. Signal Process. 44(9): 2339-2344 (1996) - [c1]Rudi Vuerinckx, Yves Rolain, Johan Schoukens, Rik Pintelon:
Design of stable IIR filters in the complex domain by automatic delay selection. ICASSP 1996: 1379-1382 - 1995
- [j2]Yves Rolain, Rik Pintelon, K. Q. Xu, H. Vold:
Best conditioned parametric identification of transfer function models in the frequency domain. IEEE Trans. Autom. Control. 40(11): 1954-1960 (1995) - 1994
- [j1]Rik Pintelon, Patrick Guillaume, Yves Rolain, Johan Schoukens, Hugo Van hamme:
Parametric identification of transfer functions in the frequency domain-a survey. IEEE Trans. Autom. Control. 39(11): 2245-2260 (1994)
Coauthor Index
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