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Ken Uchida
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2020 – today
- 2024
- [j7]Chia-Wei Pai, Ken Uchida, Munehiro Tada, Hiroki Ishikuro:
Design and analysis of a high-speed low-power comparator with regeneration enhancement and through current suppression techniques from 4 K to 300 K in 65-nm Cryo-CMOS. Microelectron. J. 144: 106066 (2024) - 2022
- [c10]Tomohisa Miyao, Takahisa Tanaka, Itsuki Imanishi, Masayuki Ichikawa, Shuya Nakagawa, Hiroki Ishikuro, Toshitsugu Sakamoto, Munehiro Tada, Ken Uchida:
Enhanced Drain Current in Transient Mode due to Long Ionization Time of Shallow Impurities at 4 K in 65-nm bulk Cryo CMOS Transistors. DRC 2022: 1-2 - 2020
- [c9]Kohei Tatehora, Yohsuke Shiiki, S. Nakagawa, Takahisa Tanaka, Ken Uchida, Hiroki Ishikuro:
A Wide Range and High Accuracy Sensor Interface with Switching Regulator for Coin-Cell Powered Tiny Wireless Sensor Node. ISCAS 2020: 1-4
2010 – 2019
- 2019
- [c8]Takahisa Tanaka, K. Tabuchi, Kohei Tatehora, Yohsuke Shiiki, S. Nakagawa, Tsunaki Takahashi, R. Shimizu, Hiroki Ishikuro, Tadahiro Kuroda, T. Yanagida, Ken Uchida:
Low-Power and ppm-Level Detection of Gas Molecules by Integrated Metal Nanosheets. VLSI Circuits 2019: 158- - 2017
- [c7]Noel Kawano, Ryan Theriot, Jack Lam, Eric Wu, Andrew Guagliardo, Dylan Kobayashi, Alberto Gonzalez, Ken Uchida, Jason Leigh:
The Destiny-class CyberCANOE - a surround screen, stereoscopic, cyber-enabled collaboration analysis navigation and observation environment. ERVR 2017: 25-30 - 2016
- [c6]Ken Uchida, Tsunaki Takahashi:
Thermal-aware CMOS: Challenges for future technology and design evolutions. ESSDERC 2016: 150-153 - 2014
- [j6]Masayuki Yamada, Ken Uchida, Yasuyuki Miyamoto:
Delay Time Component of InGaAs MOSFET Caused by Dynamic Source Resistance. IEICE Trans. Electron. 97-C(5): 419-422 (2014) - 2011
- [j5]Avelino J. Gonzalez, Setsuo Tsuruta, Yoshitaka Sakurai, Johann Nguyen, Kouhei Takada, Ken Uchida:
Using contexts to supervise a collaborative process. Artif. Intell. Eng. Des. Anal. Manuf. 25(1): 25-40 (2011) - 2010
- [j4]George Bourianoff, Michel Brillouët, Ralph K. Cavin III, Toshiro Hiramoto, James A. Hutchby, Adrian M. Ionescu, Ken Uchida:
Nanoelectronics Research for Beyond CMOS Information Processing. Proc. IEEE 98(12): 1986-1992 (2010) - [j3]Michel Brillouët, George Bourianoff, Ralph K. Cavin III, Toshiro Hiramoto, James A. Hutchby, Adrian M. Ionescu, Ken Uchida:
Regional, National, and International Nanoelectronics Research Programs: Topical Concentration and Gaps. Proc. IEEE 98(12): 1993-2004 (2010)
2000 – 2009
- 2009
- [c5]Ken Uchida:
Single-electron devices for ubiquitous and secure computing applications. DAC 2009: 301-303 - 2008
- [c4]Avelino J. Gonzalez, Setsuo Tsuruta, Johann Nguyen, Yoshitaka Sakurai, Kouhei Takada, Ken Uchida:
Using Contexts to Supervise a Collaborative Process. FLAIRS 2008: 111-112 - [c3]Yoshitaka Sakurai, Avelino J. Gonzalez, Johann Nguyen, Kouhei Takada, Ken Uchida, Setsuo Tsuruta:
Web-Based Intelligent CSCW Exploiting Context-Based Reasoning. SITIS 2008: 490-497 - [c2]Avelino J. Gonzalez, Johann Nguyen, Setsuo Tsuruta, Yoshitaka Sakurai, Kouhei Takada, Ken Uchida:
Using contexts to supervise a collaborative process. SMC 2008: 2706-2711 - 2006
- [c1]Ryuji Ohba, Daisuke Matsushita, Koichi Muraoka, Shinichi Yasuda, Tetsufumi Tanamoto, Ken Uchida, Shinobu Fujita:
Si Nanocrystal MOSFET with Silicon Nitride Tunnel Insulator for High-rate Random Number Generation. ISVLSI 2006: 231-236 - 2004
- [j2]Shinichi Yasuda, Hideki Satake, Tetsufumi Tanamoto, Ryuji Ohba, Ken Uchida, Shinobu Fujita:
Physical random number generator based on MOS structure after soft breakdown. IEEE J. Solid State Circuits 39(8): 1375-1377 (2004)
1980 – 1989
- 1989
- [j1]Yoshiaki Kamigaki, Shin-Ichi Minami, Takaaki Hagiwara, Kazunori Furusawa, Takeshi Furuno, Ken Uchida, Masaaki Terasawa, Koubu Yamazaki:
Yield and reliability of MNOS EEPROM products. IEEE J. Solid State Circuits 24(6): 1714-1722 (1989)
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