"Yield and reliability of MNOS EEPROM products."

Yoshiaki Kamigaki et al. (1989)

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DOI: 10.1109/4.45010

access: closed

type: Journal Article

metadata version: 2024-11-12

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Yoshiaki Kamigaki, Shin-Ichi Minami, Takaaki Hagiwara, Kazunori Furusawa, Takeshi Furuno, Ken Uchida, Masaaki Terasawa, Koubu Yamazaki:
Yield and reliability of MNOS EEPROM products. IEEE J. Solid State Circuits 24(6): 1714-1722 (1989)

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