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ORCIDMicroelectronics Reliability, Volume 72
Volume 72, May 2017
- Xiangfu Zhao, Wei-Ting Kary Chien:
Exploration of baking temperature effects on 28 nm BEOL reliability. 1-4 - Chong Hooi Lim
, Mohd Zulkifly Abdullah, Ishak Abdul Azid, M. S. Abdul Aziz:
Experimental and numerical investigation of flow and thermal effects on flexible printed circuit board. 5-17 - Hong Yang, Fumei Wang, He Wang, Jipeng Chang, Dengyuan Song, Chengfeng Su:
Performance deterioration of p-type single crystalline silicon solar modules affected by potential induced degradation in photovoltaic power plant. 18-23 - Xuanlong Chen, Liyuan Liu, Enliang Li:
Metal defect localization of GaAs or Si based ICs by dynamic emission microscopy. 24-29 - Nicole Doumit, B. Danoumbé, Stéphane Capraro, J. P. Chatelon, M.-F. Blanc-Mignon, Jean Jacques Rousseau:
Temperature impact on inductance and resistance values of a coreless inductor (Cu/Al2O3). 30-33 - Chan-Ching Lin, Kuei-Shu Chang-Liao, Tzung-Bin Huang, Cheng-Jung Yu, Hsueh-Chao Ko:
A new erase method for scaled NAND flash memory device. 34-38 - Haibin Wang, Ao Sheng, Shiqi Wang, Jinshun Bi, Li Chen, Xiaofeng Liu:
SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology. 39-44 - Fei Chong Ng, Aizat Abas, Z. L. Gan, Mohd Zulkifly Abdullah, F. Che Ani, M. Yusuf Tura Ali:
Discrete phase method study of ball grid array underfill process using nano-silica filler-reinforced composite-encapsulant with varying filler loadings. 45-64 - András Poppe:
Simulation of LED based luminaires by using multi-domain compact models of LEDs and compact thermal models of their thermal environment. 65-74 - Lei Zhang, Cailin Wang:
Influence of carrier lifetime distribution on the current filament in high voltage diode. 75-79 - Shimpei Yamaguchi, Zeynel Bayindir, Xiaoli He, Suresh Uppal, Purushothaman Srinivasan, Chloe Yong, Dongil Choi, Manoj Joshi, Hyuck Soo Yang, Owen Hu, Srikanth Samavedam, Dong Kyun Sohn:
Effective work-function control technique applicable to p-type FinFET high-k/metal gate devices. 80-84 - Pedro Reviriego, Salvatore Pontarelli, Juan Antonio Maestro:
A method to protect Cuckoo filters from soft errors. 85-89 - Michal Tadeusiewicz, Stanislaw Halgas:
Diagnosis of a soft short and local variations of parameters occurring simultaneously in analog CMOS circuits. 90-97 - Giyoun Roh, Hyeokjin Kim, Cheolgyu Kim, Dongwoo Kim, Bongkoo Kang:
Fast and accurate method of lifetime estimation for HfSiON/SiO2 dielectric n-MOSFETs under positive bias temperature instability. 98-102 - Shao-Wen Chen, Wan-June Chiu, Min-Song Lin, Feng-Jiun Kuo, Min-Lun Chai, Jin-Der Lee, Jong-Rong Wang, Hao-Tzu Lin, Wei-Keng Lin, Chunkuan Shih:
1D and Q2D thermal resistance analysis of micro channel structure and flat plate heat pipe. 103-114
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