• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 1,969 matches

• 2024
• 
  Vishwani D. Agrawal:
  Editorial. J. Electron. Test. 40(1): 1-2 (2024)
• 
  Vishwani D. Agrawal:
  Editorial. J. Electron. Test. 40(2): 137-138 (2024)
• 
  Vishwani D. Agrawal:
  Editorial. J. Electron. Test. 40(3): 289 (2024)
• 
  Vishwani D. Agrawal:
  Editorial. J. Electron. Test. 40(4): 417-418 (2024)
• 
  Vishwani D. Agrawal:
  Editorial. J. Electron. Test. 40(5): 589-590 (2024)
• 
  Vishwani D. Agrawal:
  Editorial. J. Electron. Test. 40(6): 689 (2024)
• 
  Rachana Ahirwar, Manisha Pattanaik, Pankaj Srivastava:
  Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop Application. J. Electron. Test. 40(2): 171-184 (2024)
• 
  Rachana Ahirwar, Manisha Pattanaik, Pankaj Srivastava:
  Investigating and Improving the Performance of Radiation-Hardened SRAM Cell with the Use of Multi-Voltage Transistors. J. Electron. Test. 40(5): 625-644 (2024)
• 
  Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Wei Cheng, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
  Multi-modal Pre-silicon Evaluation of Hardware Masking Styles. J. Electron. Test. 40(6): 723-740 (2024)
• 
  Ahilan Appathurai, Anusha Gorantla, Gladys Kiruba, Asmaa A. Hamad, Mohamed M. Hassan, N. Venkatram, Sindhu T. V.:
  Interleaved Counter Matrix Code in SRAM Memories for Continuous Adjacent Multiple Bit Upset Correction. J. Electron. Test. 40(4): 525-537 (2024)
• 
  Bahman Arasteh, Sahar Golshan, Shiva Shami, Farzad Kiani:
  Sahand: A Software Fault-Prediction Method Using Autoencoder Neural Network and K-Means Algorithm. J. Electron. Test. 40(2): 229-243 (2024)
• 
  Tamizharasi Arthanari, P. Ezhumalai:
  A Novel Framework For Optimal Test Case Generation and Prioritization Using Ent-LSOA And IMTRNN Techniques. J. Electron. Test. 40(3): 347-370 (2024)
• 
  Alberto Bosio, Samuele Germiniani, Graziano Pravadelli, Marcello Traiola:
  Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL Designs. J. Electron. Test. 40(2): 199-214 (2024)
• 
  Rongxing Cao, Yan Liu, Yulong Cai, Bo Mei, Lin Zhao, Jiayu Tian, Shuai Cui, He Lv, Xianghua Zeng, Yuxiong Xue:
  Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission. J. Electron. Test. 40(2): 185-197 (2024)
• 
  Sandip Chakraborty, Archisman Ghosh, Anindan Mondal, Bibhash Sen:
  Towards the Detection of Hardware Trojans with Cost Effective Test Vectors using Genetic Algorithm. J. Electron. Test. 40(3): 371-385 (2024)
• 
  Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura:
  Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations. J. Electron. Test. 40(1): 75-86 (2024)
• 
  Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edward Javier Patiño Nuñez, Robert Limas Sierra, Matteo Sonza Reorda:
  Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs. J. Electron. Test. 40(2): 215-228 (2024)
• 
  Thiago Santos Copetti, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Veiras Bolzani Poehls:
  A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing. J. Electron. Test. 40(2): 245-257 (2024)
• 
  Manali Dhar, Chiradeep Mukherjee, Ananya Banerjee, Debasmita Manna, Saradindu Panda, Bansibadan Maji:
  Predicting Energy Dissipation in QCA-Based Layered-T Gates Under Cell Defects and Polarisation: A Study with Machine-Learning Models. J. Electron. Test. 40(4): 435-455 (2024)
• 
  Chen Dong, Xiao Chen, Zhenyi Chen:
  Reactant and Waste Minimization during Sample Preparation on Micro-Electrode-Dot-Array Digital Microfluidic Biochips using Splitting Trees. J. Electron. Test. 40(1): 87-99 (2024)
• 
  Yibo Feng, Lu Sun, Jiarun Lu, Zhenxiao Li, Jin Tian, Yang Qiu:
  Equivalent Circuit and Damage Threshold Study of Communication Interfaces under HEMP. J. Electron. Test. 40(5): 615-624 (2024)
• 
  Aswini Kumar Gadige, Paramesha:
  Modeling and Parasitic Extraction of the MM9 Transistor for GHz/THz CMOS RF Circuit Design. J. Electron. Test. 40(6): 795-804 (2024)
• 
  Nikolaos Georgoulopoulos, Theodora Mamali, Alkis A. Hatzopoulos:
  Design and Verification of a SAR ADC SystemVerilog Real Number Model. J. Electron. Test. 40(3): 315-328 (2024)
• 
  Esther Goudet, Fabio Sureau, Paul Breuil, Luis Peña Treviño, Lirida A. B. Naviner, Jean-Marc Daveau, Philippe Roche:
  Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach. J. Electron. Test. 40(3): 291-313 (2024)
• 
  Xingna Hou, Guanxiang Qin, Ying Lu, Mulan Yi, Shouhong Chen:
  A Defect Detection Method of Mixed Wafer Map Using Neighborhood Path Filtering Clustering Algorithm. J. Electron. Test. 40(4): 419-433 (2024)
• 
  Linsen Huang:
  Analysis of the Lifecycles of Automotive Resistor Lead in Random Vibration. J. Electron. Test. 40(1): 101-106 (2024)
• 
  Zhengfeng Huang, Zishuai Li, Liting Sun, Huaguo Liang, Tianming Ni, Aibin Yan:
  A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements. J. Electron. Test. 40(1): 19-30 (2024)
• 
  Hala Ibrahim, Haytham Azmi, M. Watheq El-Kharashi, Mona Safar:
  Non-Invasive Hardware Trojans Modeling and Insertion: A Formal Verification Approach. J. Electron. Test. 40(1): 117-135 (2024)
• 
  Hiroshi Iwata, Kokoro Yamasaki, Ken-ichi Yamaguchi:
  Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements. J. Electron. Test. 40(4): 497-508 (2024)
• 
  Shawkat Sabah Khairullah:
  Formal Verification of a Dependable State Machine-Based Hardware Architecture for Safety-Critical Cyber-Physical Systems: Analysis, Design, and Implementation. J. Electron. Test. 40(4): 509-523 (2024)

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