"Analysis of Combinational Circuit Failure Rate based on Graph Partitioning ..."

Esther Goudet et al. (2024)

> Home

Details and statistics

DOI: 10.1007/S10836-024-06119-5

access: closed

type: Journal Article

metadata version: 2024-08-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/GoudetSBTNDR24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/GoudetSBTNDR24
Esther Goudet, Fabio Sureau, Paul Breuil, Luis Peña Treviño, Lirida A. B. Naviner, Jean-Marc Daveau, Philippe Roche:
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach. J. Electron. Test. 40(3): 291-313 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.