- Weiwei Wang, Yongchao Zhang, Feng You, Zhigang Yin, Ruilian Zhao:
Fault Diagnosis of Analog Circuits Based on Multi-Scale 1D Convolutional Neural Network. ATS 2023: 1-6 - Lingjuan Wu, Yifei Gao, Jiacheng Zhu, Yu Tai, Wei Hu:
Security Verification of RISC-V System Based on ISA Level Information Flow Tracking. ATS 2023: 1-6 - Hanzhi Xun, Moritz Fieback
, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui:
Characterization and Test of Intermittent Over RESET in RRAMs. ATS 2023: 1-6 - Aibin Yan, Yu Chen, Zhengfeng Huang, Jie Cui, Xiaoqing Wen:
A High-Performance and P-Type FeFET-Based Non-Volatile Latch. ATS 2023: 1-5 - Aibin Yan, Xuehua Li, Zhongyu Gao, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen:
Advanced DICE Based Triple-Node-Upset Recovery Latch with Optimized Overhead for Space Applications. ATS 2023: 1-5 - Yipei Yang, Junying Huang, Zongyue Wang, Jing Ye, Zihao Sun, Junfeng Fan, Shuai Chen, Huawei Li, Xiaowei Li, Yuan Cao:
A Template Attack on Reduction Without Reference Device on Kyber. ATS 2023: 1-6 - Chengzhen Yang, Song Jin, Jianhuang Shen, Zhuo Wang:
On Tolerating Variations and Faults in Memristor Crossbar Based Neural Network Accelerators by Network Expansion and Weight Zeroing. ATS 2023: 1-6 - Fan Yang, Tedder Meng, Zhifang Zhang, Yu Huang:
Industry Session I: On Automotive Testing. ATS 2023: 1 - Shi-Jie Ye, Yun-Ju Liu, Liuzheng Wang, Hui-Ling Zhen, Wei-Ming Zhang, Yu Huang:
Fault Simulation Acceleration Based on ARM Multi-core CPU Architecture. ATS 2023: 1-5 - Lei Yue, Jingwen Li, Liwei Zheng, Li Li, Zhanqi Cui:
Software Fault Localization Based on Combining Information Retrieval and Mutation Analysis. ATS 2023: 1-6 - Hequan Zhang, Song Jin:
On Detecting and Defending AdvDrop Adversarial Attacks by Image Blurring and Adaptive Noising. ATS 2023: 1-6 - Han Zhang, Yinhao Zhou, Ying Li:
A Portable Hardware Trojan Detection Using Graph Attention Networks. ATS 2023: 1-6 - Junna Zhong, Iris Ma, Hailong Li, Yu Huang:
Industry Session II: DFT on AI Chips. ATS 2023: 1 - Lirong Zhou, Junjun Wang, Zhao Huang, Lu Fan, Quan Wang, Jinhui Liu, Bo Wan:
A Logic Encryption-Enhanced PUF Architecture to Deceive Machine Learning-Based Modeling Attacks. ATS 2023: 1-6 - 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. IEEE 2023, ISBN 979-8-3503-0310-0 [contents]
- 2022
- Hari Addepalli, Irith Pomeranz, M. Enamul Amyeen, Suriyaprakash Natarajan, Arani Sinha, Srikanth Venkataraman:
Using Fault Detection Tests to Produce Diagnostic Tests Targeting Large Sets of Candidate Faults. ATS 2022: 120-125 - Aditi, Michael S. Hsiao:
Hybrid Rule-based and Machine Learning System for Assertion Generation from Natural Language Specifications. ATS 2022: 126-131 - Yu-You Chou, Cheng-Wen Wu
, Ming-Der Shieh, Chao-Hsun Chen:
Battery Pack Reliability and Endurance Enhancement for Electric Vehicles by Dynamic Reconfiguration. ATS 2022: 66-71 - Nikolaos Ioannis Deligiannis, Tobias Faller, Josie E. Rodriguez Condia
, Riccardo Cantoro, Bernd Becker
, Matteo Sonza Reorda
:
Using Formal Methods to Support the Development of STLs for GPUs. ATS 2022: 84-89 - Kuan-Hsun Duh, Cheng-Wen Wu
, Ming-Der Shieh, Chao-Hsun Chen, Ming-Yan Fan:
Aging Impact of Power MOSFETs in Charger with Different Operation Frequency. ATS 2022: 54-59 - Tong-Yu Hsieh, Pao-Wei Tsui, Jun-Tsung Wu:
On No-Reference Error Detection of an Image Stitching System Based on Error-Tolerance. ATS 2022: 150-155 - Huixian Huang, Xiaole Cui, Shuming Zhang, Ge Li, Xiaoxin Cui:
An obfuscation scheme of scan chain to protect the cryptographic chips. ATS 2022: 19-24 - Wan Ju Huang, Hsiao-Wen Fu, Tsung-Chu Huang:
AN-HRNS: AN-Coded Hierarchical Residue Number System for Reliable Neural Network Accelerators. ATS 2022: 132-137 - Hao Huang, Haihua Shen, Shan Li, Huawei Li:
A Hardware Trojan Trigger Localization Method in RTL based on Control Flow Features. ATS 2022: 138-143 - Zih-Ming Huang, Dun-An Yang, Jing-Jia Liou, Harry H. Chen:
FPGA-Based Emulation for Accelerating Transient Fault Reduction Analysis. ATS 2022: 144-149 - Utsav Jana, Sourav Banerjee
, Binod Kumar, Madhu B, Shankar Umapathi, Masahiro Fujita:
Deep Learning-assisted Scan Chain Diagnosis with Different Fault Models during Manufacturing Test. ATS 2022: 72-77 - Takaaki Kato, Yousuke Miyake, Seiji Kajihara:
On Correction of A Delay Value Using Ring-Oscillators for Aging Detection and Prediction. ATS 2022: 60-65 - Troya Çagil Köylü, Moritz Fieback
, Said Hamdioui, Mottaqiallah Taouil:
Using Hopfield Networks to Correct Instruction Faults. ATS 2022: 102-107 - Gaurav Kumar
, Anjum Riaz, Yamuna Prasad, Satyadev Ahlawat:
A New Access Protocol for Elevating the Security of IJTAG Network. ATS 2022: 31-36 - Jin-Fu Li, Jing-Jia Liou:
Foreword: ATS 2022. ATS 2022: x