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Simone Borri
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2020 – today
- 2022
- [i1]Marco Seminara, Tecla Gabbrielli, Nicola Corrias, Simone Borri, Luigi Consolino, Marco Meucci, Paolo De Natale, Francesco Cappelli, Jacopo Catani:
Characterization of noise regimes in Mid-IR free-space optical communication based on quantum cascade lasers. CoRR abs/2208.00835 (2022)
2010 – 2019
- 2016
- [j4]Simone Borri, Mario Siciliani de Cumis, Giacomo Insero, Saverio Bartalini, Pablo Cancio Pastor, Davide Mazzotti, Iacopo Galli, Giovanni Giusfredi, Gabriele Santambrogio, Anatoliy Savchenkov, Danny Eliyahu, Vladimir Ilchenko, Naota Akikusa, Andrey Matsko, Lute Maleki, Paolo De Natale:
Tunable Microcavity-Stabilized Quantum Cascade Laser for Mid-IR High-Resolution Spectroscopy and Sensing. Sensors 16(2): 238 (2016)
2000 – 2009
- 2006
- [j3]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan:
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. J. Electron. Test. 22(3): 287-296 (2006) - 2005
- [j2]Simone Borri, Magali Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. J. Electron. Test. 21(2): 169-179 (2005) - [j1]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Hage-Hassan:
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. J. Electron. Test. 21(5): 551-561 (2005) - 2004
- [c7]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan:
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. Asian Test Symposium 2004: 266-271 - [c6]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan:
Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution. ETS 2004: 140-145 - [c5]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri:
March iC-: An Improved Version of March C- for ADOFs Detection. VTS 2004: 129-138 - 2003
- [c4]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri:
Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. Asian Test Symposium 2003: 250-255 - [c3]Simone Borri, Magali Hage-Hassan, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
Defect-oriented dynamic fault models for embedded-SRAMs. ETW 2003: 23-28 - 2002
- [c2]Emmanuel Rondey, Yann Tellier, Simone Borri:
A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. IOLTW 2002: 251-255 - [c1]Emmanuel Rondey, Yann Tellier, Simone Borri:
A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. MTDT 2002: 57-61
Coauthor Index
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