"Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March ..."

Luigi Dilillo et al. (2004)

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DOI: 10.1109/ATS.2004.75

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan:
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. Asian Test Symposium 2004: 266-271

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