"A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with ..."

Emmanuel Rondey, Yann Tellier, Simone Borri (2002)

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DOI: 10.1109/OLT.2002.1030227

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Emmanuel Rondey, Yann Tellier, Simone Borri:
A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. IOLTW 2002: 251-255

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