"A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with ..."

Emmanuel Rondey, Yann Tellier, Simone Borri (2002)

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DOI: 10.1109/MTDT.2002.1029764

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Emmanuel Rondey, Yann Tellier, Simone Borri:
A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. MTDT 2002: 57-61

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