"Efficient March Test Procedure for Dynamic Read Destructive Fault ..."

Luigi Dilillo et al. (2005)

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DOI: 10.1007/S10836-005-1169-1

access: closed

type: Journal Article

metadata version: 2023-03-21

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Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Hage-Hassan:
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. J. Electron. Test. 21(5): 551-561 (2005)

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