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ORCIDPaul H. Bardell
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1990 – 1999
- 1993
[j11]Jacob Savir, Paul H. Bardell:
Built-In Self-Test: Milestones and Challenges. VLSI Design 1(1): 23-44 (1993)- 1992
- [j10]Paul H. Bardell:
Discrete logarithms a parallel pseudorandom pattern generator analysis method. J. Electron. Test. 3(1): 17-31 (1992) - [j9]Paul H. Bardell:
Primitive polynomials of degree 301 through 500. J. Electron. Test. 3(2): 175-176 (1992) - [j8]Paul H. Bardell:
Calculating the effects of linear dependencies in m-sequences used as test stimuli. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(1): 83-86 (1992) - 1991
- [j7]Jacob Savir, Paul H. Bardell:
Partitioning of polynomial tasks: test generation, an example. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(11): 1465-1468 (1991) - [c8]Paul H. Bardell, Michael J. Lapointe:
Production Experience with Built-In Self-Test in the IBM ES/9000 System. ITC 1991: 28-36 - 1990
- [j6]Paul H. Bardell:
Design considerations for Parallel pseudoRandom Pattern Generators. J. Electron. Test. 1(1): 73-87 (1990) - [c7]Paul H. Bardell:
Analysis of cellular automata used as pseudorandom pattern generators. ITC 1990: 762-768
1980 – 1989
- 1989
- [c6]Paul H. Bardell:
Calculating the Effects of Linear Dependencies in m-Sequences Used as Test Stimuli. ITC 1989: 252-256 - 1988
- [j5]Paul H. Bardell, William H. McAnney:
Built-in test for RAMs. IEEE Des. Test 5(4): 29-36 (1988) - 1987
- [j4]Paul H. Bardell:
TTTC 10th Anniversary. IEEE Des. Test 4(4): 50-54 (1987) - 1986
- [j3]Paul H. Bardell, William H. McAnney:
Pseudorandom Arrays for Built-In Tests. IEEE Trans. Computers 35(7): 653-658 (1986) - 1985
- [c5]Paul H. Bardell, William H. McAnney:
Self-Test of Random Access Memories. ITC 1985: 352-355 - 1984
- [j2]Jacob Savir, Gary S. Ditlow, Paul H. Bardell:
Random Pattern Testability. IEEE Trans. Computers 33(1): 79-90 (1984) - [j1]Jacob Savir, Paul H. Bardell:
On Random Pattern Test Length. IEEE Trans. Computers 33(6): 467-474 (1984) - [c4]William H. McAnney, Paul H. Bardell, V. P. Gupta:
Random Testing for Stuck-At Storage Cells in an Embedded Memory. ITC 1984: 157-166 - [c3]Paul H. Bardell, William H. McAnney:
Parallel Pseudorandom Sequences for Built-In Test. ITC 1984: 302-308 - 1983
- [c2]Jacob Savir, Paul H. Bardell:
On Random Pattern Test Length. ITC 1983: 95-107 - 1982
- [c1]Paul H. Bardell, William H. McAnney:
Self-Testing of Multichip Logic Modules. ITC 1982: 200-204
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