"Random Testing for Stuck-At Storage Cells in an Embedded Memory."

William H. McAnney, Paul H. Bardell, V. P. Gupta (1984)

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type: Conference or Workshop Paper

metadata version: 2002-11-22

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William H. McAnney, Paul H. Bardell, V. P. Gupta:
Random Testing for Stuck-At Storage Cells in an Embedded Memory. ITC 1984: 157-166

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