default search action
"On Random Pattern Test Length."
Jacob Savir, Paul H. Bardell (1984)
- Jacob Savir, Paul H. Bardell:
On Random Pattern Test Length. IEEE Trans. Computers 33(6): 467-474 (1984)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.