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ORCIDShalabh Goyal
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Journal Articles
- 2008
[j2]Shalabh Goyal, Abhijit Chatterjee:
Linearity Testing of A/D Converters Using Selective Code Measurement. J. Electron. Test. 24(6): 567-576 (2008)- 2007
- [j1]Shalabh Goyal, Abhijit Chatterjee, Michael Purtell:
A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters. J. Electron. Test. 23(1): 95-106 (2007)
Conference and Workshop Papers
- 2009
- [c8]Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin:
Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium 2009: 69-74 - [c7]Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin:
Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. ETS 2009: 3-8 - 2006
- [c6]Shalabh Goyal, Abhijit Chatterjee, Yanan Shieh:
Enhanced A/D Converter Signal-to-Noise-Ratio Testing in the Presence of Sampling Clock Jitter. ATS 2006: 307-312 - [c5]Shalabh Goyal, Abhijit Chatterjee, Mike Atia:
Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test. ETS 2006: 165-172 - [c4]Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee:
Low Cost Parametric Failure Diagnosis of RF Transceivers. ETS 2006: 205-212 - 2005
- [c3]Shalabh Goyal, Michael Purtell:
Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester. Asian Test Symposium 2005: 14-17 - [c2]Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag:
Test time reduction of successive approximation register A/D converter by selective code measurement. ITC 2005: 8 - 2004
- [c1]Ganesh Srinivasan, Shalabh Goyal, Abhijit Chatterjee:
Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits. Asian Test Symposium 2004: 302-307
Coauthor Index
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