"Low Cost Dynamic Test Methodology for High Precision ΣD ADCs."

Sehun Kook et al. (2009)

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DOI: 10.1109/ATS.2009.76

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin:
Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium 2009: 69-74

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