"Test time reduction of successive approximation register A/D converter by ..."

Shalabh Goyal et al. (2005)

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DOI: 10.1109/TEST.2005.1583979

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/GoyalCAICSKH05
Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag:
Test time reduction of successive approximation register A/D converter by selective code measurement. ITC 2005: 8

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