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ORCIDGanesh Srinivasan
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2020 – today
- 2020
[c17]Kenny Hong, Yumiko Sakamoto, Ganesh Srinivasan, Pourang Irani:
Exploring technology for neonatal resuscitation training. AH 2020: 12:1-12:9
2010 – 2019
- 2012
- [j6]Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya:
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(7): 1088-1101 (2012) - 2011
- [j5]Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force:
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. J. Electron. Test. 27(3): 241-252 (2011) - [c16]Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya:
Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation. VLSI Design 2011: 274-279 - 2010
- [j4]Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler:
Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems. IEEE Des. Test Comput. 27(6): 6-17 (2010) - [j3]Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam:
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices. J. Electron. Test. 26(4): 405-417 (2010) - [c15]Shyam Kumar Devarakond, Shreyas Sen, Vishwanath Natarajan, Aritra Banerjee, Hyun Woo Choi, Ganesh Srinivasan, Abhijit Chatterjee:
Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures. Asian Test Symposium 2010: 283-288 - [c14]Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed:
RADPro: Automatic RF analyzer and diagnostic program generation tool. ITC 2010: 325-333
2000 – 2009
- 2008
- [j2]Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee:
Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers. IEEE Des. Test Comput. 25(2): 150-159 (2008) - [c13]Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler:
Optimized EVM Testing for IEEE 802.11a/n RF ICs. ITC 2008: 1-10 - [c12]Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler:
Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms. ITC 2008: 1-9 - 2007
- [c11]Ganesh Srinivasan, Abhijit Chatterjee, Vishwanath Natarajan:
Fourier Spectrum-Based Signature Test: A Genetic CAD Toolbox for Reliable RF Testing Using Low-Performance Test Resources. ATS 2007: 139-142 - [c10]Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee, Craig Force:
Novel Cross-Loopback Based Test Approach for Specification Test of Multi-Band, Multi-Hardware Radios. VTS 2007: 297-302 - 2006
- [c9]Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee:
Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms. DATE 2006: 658-663 - [c8]Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee:
On-Line Error Detection in Wireless RF Transmitters Using Real-time Streaming Data. IOLTS 2006: 159-164 - [c7]Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler:
Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. VTS 2006: 222-227 - 2005
- [j1]Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee:
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. J. Electron. Test. 21(3): 323-339 (2005) - [c6]Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee:
Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. ETS 2005: 68-73 - [c5]Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee:
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. VLSI Design 2005: 289-294 - 2004
- [c4]Ganesh Srinivasan, Shalabh Goyal, Abhijit Chatterjee:
Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits. Asian Test Symposium 2004: 302-307 - [c3]Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee:
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. DATE 2004: 280-285 - [c2]Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee:
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. DELTA 2004: 372-377 - [c1]Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee:
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS 2004: 229-236
Coauthor Index
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